Issue No. 07 - July (1970 vol. 19)
J.P. Robinson , University of Iowa
This paper describes a sequential suboptimal test selection procedure for a combinational logic circuit. The goal is package level diagnosis assuming a single permanent fault and multiple outputs. The method extends to multiple permanent faults and/or a single output since the starting point is a fault table of test inputs as columns, faults as rows, and resulting output as the entry.
J. Robinson, "R70-24 A Procedure for Selecting Diagnostic Tests," in IEEE Transactions on Computers, vol. 19, no. , pp. 660, 1970.