Issue No. 03 - March (1969 vol. 18)
G.D. Hornbuckle , IEEE
Two procedures are presented for detecting and diagnosing arbitrary single-gate failures in combinational logic circuits. A gate is defined as any multiple-input single-output combinational circuit, and a failure is any detectable transformation of the correct gate function. The testing procedures do not require the construction of a fault table and will locate, to within an equivalence class, the faulty gate and describe its failure.
Combinational logic, computer failure detection, diagnostic test generation, fault diagnosis, single-gate failures.
R. Spann and G. Hornbuckle, "Diagnosis of Single-Gate Failures in Combinational circuits," in IEEE Transactions on Computers, vol. 18, no. , pp. 216-220, 1969.