Issue No. 10 - October (1968 vol. 17)
H.D. Goldman , IEEE
Abstract?A procedure for incorporating the deleterious effect of solder connections into reliability calculations for integrated circuits is presented. This is incorporated into a study concerning the advisability of applying triplicated majority voting to integrated circuits.
Index Terms?Error reduction factor, integrated circuit, reliability, solder connections, triplicated majority voting.
H. Goldman and J. Rom, "Considering Solder Connections, Does Triplicated Majority Voting Apply to Integrated Circuits," in IEEE Transactions on Computers, vol. 17, no. , pp. 990-992, 1968.