Probabilistic Analysis of Probe Reliability in Differential Gene Expression Studies with Short Oligonucleotide Arrays
Issue No. 01 - January-February (2011 vol. 8)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/TCBB.2009.38
Leo Lahti , Helsinki University of Technology, TKK
Laura L. Elo , University of Turku, Turku
Tero Aittokallio , University of Turku, Turku
Samuel Kaski , Helsinki University of Technology, TKK
Probe defects are a major source of noise in gene expression studies. While existing approaches detect noisy probes based on external information such as genomic alignments, we introduce and validate a targeted probabilistic method for analyzing probe reliability directly from expression data and independently of the noise source. This provides insights into the various sources of probe-level noise and gives tools to guide probe design.
Applications, biology and genetics, parameter learning, probabilistic algorithms.
Leo Lahti, Laura L. Elo, Tero Aittokallio, Samuel Kaski, "Probabilistic Analysis of Probe Reliability in Differential Gene Expression Studies with Short Oligonucleotide Arrays", IEEE/ACM Transactions on Computational Biology and Bioinformatics, vol. 8, no. , pp. 217-225, January-February 2011, doi:10.1109/TCBB.2009.38