Probabilistic Analysis of Probe Reliability in Differential Gene Expression Studies with Short Oligonucleotide Arrays
Issue No. 01 - January-February (2011 vol. 8)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/TCBB.2009.38
Samuel Kaski , Helsinki University of Technology, TKK
Laura L. Elo , University of Turku, Turku
Leo Lahti , Helsinki University of Technology, TKK
Tero Aittokallio , University of Turku, Turku
Probe defects are a major source of noise in gene expression studies. While existing approaches detect noisy probes based on external information such as genomic alignments, we introduce and validate a targeted probabilistic method for analyzing probe reliability directly from expression data and independently of the noise source. This provides insights into the various sources of probe-level noise and gives tools to guide probe design.
Applications, biology and genetics, parameter learning, probabilistic algorithms.
Samuel Kaski, Laura L. Elo, Leo Lahti, Tero Aittokallio, "Probabilistic Analysis of Probe Reliability in Differential Gene Expression Studies with Short Oligonucleotide Arrays", IEEE/ACM Transactions on Computational Biology and Bioinformatics, vol. 8, no. , pp. 217-225, January-February 2011, doi:10.1109/TCBB.2009.38