The Community for Technology Leaders
2016 IEEE/ACM 7th International Workshop on Emerging Trends in Software Metrics (2016)
Austin, Texas, USA
May 15, 2016 to May 15, 2016
ISSN: 2327-0969
ISBN: 978-1-4503-4177-6
TABLE OF CONTENTS

[Title page iii] (PDF)

pp. iii

Table of contents (PDF)

pp. v-vi

Committees (PDF)

pp. viii-ix

Author index (PDF)

pp. 64
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