2018 IEEE Winter Conference on Applications of Computer Vision (WACV) (2018)
Lake Tahoe, NV, USA
Mar 12, 2018 to Mar 15, 2018
We present a computer vision system that can transcribe the text on tiny printed labels stacked beneath pinned insects (as found in museum collections). The approach uses multiple views of each label because the labels are often occluded by the pin, the insect specimen, and other labels. Our approach handles occlusion and the extreme viewing angles required to image the stacked labels. Automated image analysis identifies the lines of text and then aligns and rectifies the images. Combining the aligned and rectified images from multiple viewpoints enables us to create a composite image that can be read using optical character recognition tools (OCR) to extract the text. We provide experimental demonstration using both museum specimens and experimental test labels.
computer vision, document image processing, optical character recognition, text analysis
N. Agarwal, N. Ferrier and M. Hereld, "Towards Automated Transcription of Label Text from Pinned Insect Collections," 2018 IEEE Winter Conference on Applications of Computer Vision (WACV), Lake Tahoe, NV, USA, 2018, pp. 189-198.