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2013 IEEE 31st VLSI Test Symposium (VTS) (2010)
Santa Cruz, CA USA
Apr. 19, 2010 to Apr. 22, 2010
ISSN: 1093-0167
ISBN: 978-1-4244-6649-8
TABLE OF CONTENTS

Design, analysis, and test of low-power and reliable flexible electronics (PDF)

Kwang-Ting Cheng , Univ. of California, Santa Barbara, CA, USA
Tsung-Ching Huang , Univ. of California, Santa Barbara, CA, USA
pp. 82

Evaluating yield and testing impact of sub-wavelength lithography (Abstract)

Wing Chiu Tam , ECE Dept., Carnegie Mellon Univ., Pittsburgh, PA, USA
R D Blanton , ECE Dept., Carnegie Mellon Univ., Pittsburgh, PA, USA
Wojciech P Maly , ECE Dept., Carnegie Mellon Univ., Pittsburgh, PA, USA
pp. 200-205

Calibration-assisted production testing for digitally-calibrated ADCs (Abstract)

Hsiu-Ming Chang , Electr. & Comput. Eng. Dept., Univ. of California, Santa Barbara, CA, USA
Kuan-Yu Lin , Ind. Technol. Res. Inst., Hsinchu, Taiwan
Kwang-Ting Cheng , Electr. & Comput. Eng. Dept., Univ. of California, Santa Barbara, CA, USA
pp. 295-300
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