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2013 IEEE 31st VLSI Test Symposium (VTS) (2009)
May 3, 2009 to May 7, 2009
ISSN: 1093-0167
ISBN: 978-0-7695-3598-2
TABLE OF CONTENTS
Papers

Acknowledgements (PDF)

pp. xviii

[Front cover] (PDF)

pp. C1
Papers

Table of contents (PDF)

pp. v-ix

list-reviewer (PDF)

pp. xvi-xvii

Title Page i (PDF)

pp. i

Title Page iii (PDF)

pp. iii

Foreword (PDF)

pp. x

Organizing Committee (PDF)

pp. xi-xiii

Awards (PDF)

pp. xxv-xxvii

[Roster] (PDF)

pp. 342

Author Index (PDF)

pp. 339-341
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