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2013 IEEE 31st VLSI Test Symposium (VTS) (2008)
Apr. 27, 2008 to May 1, 2008
ISSN: 1093-0167
ISBN: 0-7695-3123-7
TABLE OF CONTENTS
Papers

Table of contents (PDF)

pp. v-xi

Bit-Error Rate Estimation for Bang-Bang Clock and Data Recovery Circuit in High-Speed Serial Links (Abstract)

Dongwoo Hong , Dept. of Electr. & Comput. Eng., Univ. of California, Santa Barbara, CA
Kwang-Ting Cheng , Dept. of Electr. & Comput. Eng., Univ. of California, Santa Barbara, CA
pp. 17-22
Papers

Title Page i (PDF)

pp. i

Title Page iii (PDF)

pp. iii

Foreword (PDF)

pp. xii

Committee Lists (PDF)

pp. xiii-xv

Best Paper Awards (PDF)

pp. xxviii-xxx

Author Index (PDF)

pp. 411-412
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