25th IEEE VLSI Test Symposium (VTS'07) (2007)
May 6, 2007 to May 10, 2007
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/VTS.2007.48
Simon Wilson , Trinity College Dublin, Ireland
Ben Flood , Trinity College Dublin, Ireland
Suresh Goyal , Bell Labs Ireland
Jim Mosher , Lucent Technologies, USA
Susan Bergin , Bell Labs Ireland
Joseph O'Brien , Lucent Technologies, Ireland
Robert Kennedy , Lucent Technologies, Ireland
We describe estimation of the parameters of a manufacturing test and repair model using data available from that test. The model allows imperfect testing and imperfect repair. The principal problem that we address is of parameter identification, given insufficient data, that we address by making conservative assumptions on the property being measured and the associated parameter values. Several cases of commonly occurring test types, in the manufacture of electronic products, are considered.
R. Kennedy et al., "Parameter Estimation for a Model with Both Imperfect Test and Repair," 25th IEEE VLSI Test Symposium (VTS'07)(VTS), Berkeley, California, 2007, pp. 271-276.