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2013 IEEE 31st VLSI Test Symposium (VTS) (2004)
Napa Valley, California
Apr. 25, 2004 to Apr. 29, 2004
ISSN: 1093-0167
ISBN: 0-7695-2134-7
pp: 31
Janak H. Patel , University of Illinois at Urbana Champaign
Manish Sharma , University of Illinois at Urbana Champaign
ABSTRACT
In this paper we analyze the coverage of distributed delay defects, on untested but functionally sensitizable paths, achieved by robustly testing a subset of paths in the circuit. This is measured by translating the information gained from robust testing into a set of linear constraints on edge delays and then using these to bound the circuit delay. Surprisingly, the results of our experiments on ISCAS benchmark circuits show that robust testing of a subset of paths in the circuit, may not cover distributed delay defects on the remaining paths very well at all.
INDEX TERMS
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CITATION
Janak H. Patel, Manish Sharma, "What Does Robust Testing a Subset of Paths, Tell us about the Untested Paths in the Circuit?", 2013 IEEE 31st VLSI Test Symposium (VTS), vol. 00, no. , pp. 31, 2004, doi:10.1109/VTEST.2004.1299222
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