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22nd IEEE VLSI Test Symposium, 2004. Proceedings. (2004)
Napa Valley, California
Apr. 25, 2004 to Apr. 29, 2004
ISSN: 1093-0167
ISBN: 0-7695-2134-7
pp: 9
Jennifer Dworak , Texas A&M University
David Dorsey , Texas A&M University
Amy Wang , Texas A&M University
M. Ray Mercer , Texas A&M University
ABSTRACT
In previous work, we have shown that optimizing the number of site observations leads to more defect detection. However, for increasingly difficult defects, optimizing patterns for balanced random excitation also enhances test effectiveness. We can also reduce the effect of undetected defects by choosing tests that minimize the likelihood of field failures.
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CITATION

A. Wang, D. Dorsey, M. R. Mercer and J. Dworak, "Excitation, Observation, and ELF-MD: Optimization Criteria for High Quality Test Sets," 22nd IEEE VLSI Test Symposium, 2004. Proceedings.(VTS), Napa Valley, California, 2004, pp. 9.
doi:10.1109/VTEST.2004.1299219
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