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2013 IEEE 31st VLSI Test Symposium (VTS) (2004)
Napa Valley, California
Apr. 25, 2004 to Apr. 29, 2004
ISSN: 1093-0167
ISBN: 0-7695-2134-7
pp: 9
Amy Wang , Texas A&M University
David Dorsey , Texas A&M University
M. Ray Mercer , Texas A&M University
Jennifer Dworak , Texas A&M University
ABSTRACT
In previous work, we have shown that optimizing the number of site observations leads to more defect detection. However, for increasingly difficult defects, optimizing patterns for balanced random excitation also enhances test effectiveness. We can also reduce the effect of undetected defects by choosing tests that minimize the likelihood of field failures.
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CITATION
Amy Wang, David Dorsey, M. Ray Mercer, Jennifer Dworak, "Excitation, Observation, and ELF-MD: Optimization Criteria for High Quality Test Sets", 2013 IEEE 31st VLSI Test Symposium (VTS), vol. 00, no. , pp. 9, 2004, doi:10.1109/VTEST.2004.1299219
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