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Proceedings 20th IEEE VLSI Test Symposium (VTS 2002) (2002)
Monterey, California
Apr. 28, 2002 to May 2, 2002
ISBN: 0-7695-1570-3
pp: 0445
Fidel Muradali , Agilent Technologies
Mike Ricchetti , Intellitech
Bart Vermeulen , Philips
Bob Gottlieb , Intel Corporation
C. J. Clark , Intellitech
INDEX TERMS
CITATION

B. Gottlieb et al., "Reducing Time to Volume and Time to Market: Is Silicon Debug and Diagnosis the Answer?," Proceedings 20th IEEE VLSI Test Symposium (VTS 2002)(VTS), Monterey, California, 2002, pp. 0445.
doi:10.1109/VTS.2002.1011178
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