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2013 IEEE 31st VLSI Test Symposium (VTS) (1998)
Monterey, California
Apr. 26, 1998 to Apr. 30, 1998
ISSN: 1093-0167
ISBN: 0-8186-8436-4
pp: 446
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CITATION
J.H. Patel, I. Hamzaoglu, "20.2 New Techniques for Deterministic Test Pattern Generation", 2013 IEEE 31st VLSI Test Symposium (VTS), vol. 00, no. , pp. 446, 1998, doi:10.1109/VTEST.1998.670910
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