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25th IEEE VLSI Test Symposium (VTS'07) (2007)
Berkeley, CA
May 6, 2007 to May 10, 2007
ISSN: 1093-0167
ISBN: 0-7695-2812-0

Foreword (PDF)

pp. xiii

Code-Density Test of Analog-to-Digital Converters Using Single Low-Linearity Stimulus Signal (Abstract)

Le Jin , National Semiconductor Corporation, USA
Degang Chen , Iowa State University, USA
Randall Geiger , Iowa State University, USA
pp. 303-310
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