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23rd IEEE VLSI Test Symposium (VTS'05) (2005)
Palm Springs, California, USA
May 1, 2005 to May 5, 2005
ISSN: 1093-0167
ISBN: 0-7695-2314-5
TABLE OF CONTENTS

Cantilever type probe card for at-speed memory test on wafer (Abstract)

H. Iwai , Toshiba Corp. Semicond. Co., Kawasaki, Japan
A. Nakayama , Toshiba Corp. Semicond. Co., Kawasaki, Japan
N. Itoga , Toshiba Corp. Semicond. Co., Kawasaki, Japan
pp. 85-89

Low-cost alternate EVM test for wireless receiver systems (Abstract)

A. Halder , Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
A. Chatterjee , Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
pp. 255-260
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