The Community for Technology Leaders
2013 IEEE International Test Conference (ITC) (2006)
Santa Clara, CA USA
Oct. 22, 2006 to Oct. 27, 2006
ISSN: 1089-3539
ISBN: 1-4244-0291-3
TABLE OF CONTENTS

Managing test, yield, quality, and cost in fabless manufacturing model (PDF)

Chris Malachowsky , Co-Founder, NVIDIA Fellow and Senior Vice President, Engineering and Operations
pp. 12

The impact of globalization on test and the test engineer [Invited Address] (PDF)

Greg Jordan , Manufacturing Test Engineering, Cisco System, Inc.
pp. 13

On the need for convergence between design validation and test (PDF)

Siva Yerramilli , General Manager, Design and Technology Solutions (DTS), Technology and Manufacturing Group, Intel Corporation
pp. 14

It's not what you can make - It's what you can test (PDF)

W. Robert Daasch , Professor, Electrical and Computer Engineering, Portland State University
pp. 15

Zero defect: Mission impossible? (PDF)

Erik Jan Marinissen , Philips Research Laboratories, IC Design - Digital Design & Test, High Tech Campus 5, M/S WAY 41, 5656 AE Eindhoven, The Netherlands. erik.jan.marinissen@philips.com
Sandeep Kumar Goel , Philips Research Laboratories, IC Design - Digital Design & Test, High Tech Campus 5, M/S WAY 41, 5656 AE Eindhoven, The Netherlands. sandeepkumar.goel@philips.com
pp. 1

Zero defect mission requires an arsenal (Abstract)

D. Migl , Freescale, Inc., Austin, TX
pp. 1-2

Zero Defects: Managing Variation & International In The Total Value Chain (Abstract)

R. van Rijsinge , Bus. Unit Automotive & Identification, Philips Semicond., Nijmegen
pp. 1-2

Role of test in yield learning for 65 nm and beyond (PDF)

T. Ho , Credence Syst. Corp., Milpitas, CA
pp. 1-2

Role of test in yield learning for 65nm and beyond (PDF)

Sanjiv Taneja , Vice President, General Manager, Encounter Test, Cadence Design Systems, Inc.
pp. 1
193 ms
(Ver 3.3 (11022016))