The Community for Technology Leaders
2004 International Conferce on Test (2004)
Charlotte, NC, USA
Oct. 26, 2004 to Oct. 28, 2004
ISBN: 0-7803-8580-2
TABLE OF CONTENTS

Trends in manufacturing test methods and their implications (PDF)

S. Kundu , Design Technol., Intel Corp., USA
T.M. Mak , Design Technol., Intel Corp., USA
R. Galivanche , Design Technol., Intel Corp., USA
pp. 679-687

Analysis of delay caused by bridging faults in RLC interconnects (PDF)

Q. Zhou , Dept. of Electr. & Comput. Eng., Rice Univ., Houston, TX, USA
K. Mohanram , Dept. of Electr. & Comput. Eng., Rice Univ., Houston, TX, USA
pp. 1044-1052

Electronic circuit comprising a secret sub-module (PDF)

H. Fleury , Philips Semicond., France
pp. 1412
84 ms
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