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2013 IEEE International Test Conference (ITC) (1991)
Nashville, TN, USA USA
Oct. 26, 1991 to Oct. 30, 1991
ISSN: 1089-3539
ISBN: 0-8186-9156-5
TABLE OF CONTENTS

Built-in self-test for high-speed data-path circuitry (Abstract)

pp. 47,48,49,50,51,52,53,54,55,56
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