The Community for Technology Leaders
1988 International Test Conference (1988)
Washington, DC, USA
Sept. 12, 1988 to Sept. 14, 1988
ISSN: 1089-3539
ISBN: 0-8186-0870-6
TABLE OF CONTENTS

Elimination of incoming test based upon in-process failure and repair costs (Abstract)

W.D. Ballew , AT&T, Oklahoma City, OK, USA
L.M. Streb , AT&T, Oklahoma City, OK, USA
pp. 308-313
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