2016 IEEE 16th International Working Conference on Source Code Analysis and Manipulation (SCAM) (2016)

Raleigh, North Carolina, United States

Oct. 2, 2016 to Oct. 3, 2016

ISBN: 978-1-5090-3848-0

pp: 97-106

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/SCAM.2016.24

ABSTRACT

We present a new fault localization algorithm, called Vautrin, built on an approximation of causality based on call graphs. The approximation of causality is done using software mutants. The key idea is that if a mutant is killed by a test, certain call graph edges within a path between the mutation point and the failing test are likely causal. We evaluate our approach on the fault localization benchmark by Steimann et al. totaling 5,836 faults. The causal graphs are extracted from 88,732 nodes connected by 119,531 edges. Vautrin improves the fault localization effectiveness for all subjects of the benchmark. Considering the wasted effort at the method level, a classical fault localization evaluation metric, the improvement ranges from 3% to 55%, with an average improvement of 14%.

INDEX TERMS

Approximation algorithms, Software, Software algorithms, Prediction algorithms, Computer bugs, Inference algorithms, Algorithm design and analysis

CITATION

Vincenzo Musco,
Martin Monperrus,
Philippe Preux,
"Mutation-Based Graph Inference for Fault Localization",

*2016 IEEE 16th International Working Conference on Source Code Analysis and Manipulation (SCAM)*, vol. 00, no. , pp. 97-106, 2016, doi:10.1109/SCAM.2016.24