2010 14th Panhellenic Conference on Informatics (2010)
Sept. 10, 2010 to Sept. 12, 2010
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/PCI.2010.44
In this paper a novel algorithm is presented for embedding test sets containing don’t care values into sequences generated by binary counters. Experiments carried out on randomly generated test sets reveal that the proposed scheme results in shorter test sequences compared to randomly filling the don’t care bits with ‘0’ and ‘1’ values. Furthermore, comparison with schemes that have been proposed in the open literature for embedding test sets into hardware-generated sequences reveal that the proposed schemes presents comparable results, while in many cases it performs better.
D. Kavvadias, H. Antonopoulou, S. Sinitos, C. Efstathiou and I. Voyiatzis, "On Embedding Test Sets into Hardware Generated Sequences," 2010 14th Panhellenic Conference on Informatics(PCI), Tripoli, Greece, 2010, pp. 158-163.