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IEEE International Performance Computing and Communications Conference (2011)
Orlando, FL, USA
Nov. 17, 2011 to Nov. 19, 2011
ISBN: 978-1-4673-0010-0
pp: 1-8
Xiao Qin , Department of Computer Science and Software Engineering, Auburn University, Auburn, AL 36849
Xiaojun Ruan , Department of Computer Science, West Chester University of Pennsylvania, West Chester, PA 19383
Mohammed Alghamdi , Department of Computer Science, Al-Baha University, Al-Baha City, Kingdom of Saudi Arabia
Meikang Qiu , Department of Electrical and Computer Engineering University of Kentucky, Lexington, Kentucky, 40506
Shu Yin , Department of Computer Science and Software Engineering, Auburn University, Auburn, AL 36849
Jiong Xie , Department of Computer Science and Software Engineering, Auburn University, Auburn, AL 36849
Yun Tian , Department of Computer Science and Software Engineering, Auburn University, Auburn, AL 36849
ABSTRACT
We develop a mathematical model -- MREED -- to quantitatively evaluate the failure rate of energy-efficient parallel storage systems. The Power-Aware Redundant Array of Inexpensive Disk (PARAID) aims to reduce energy use of commodity server-class disks without specialized hardware. The goal of PARAID is to skewed striping pattern to adapt to the system load by changing the number of powered disks. By spinning down disks during light workloads, PARAID can reduce power consumption, while still meeting performance demands. We show that MREED can be used to estimate a five-disk PARAID-0 system. We validate the accuracy of MREED using the DiskSim simulator. Our approach shows that MREED can rely on file access pattern to estimate system utilization correctly. Furthermore, even thought PARAID may achieve reasonable reliability, our model shows that PARAID's reliability is affected by data locality.
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CITATION
Xiao Qin, Xiaojun Ruan, Mohammed Alghamdi, Meikang Qiu, Shu Yin, Jiong Xie, Yun Tian, "Reliability analysis of an energy-aware RAID system", IEEE International Performance Computing and Communications Conference, vol. 00, no. , pp. 1-8, 2011, doi:10.1109/PCCC.2011.6108068
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