Proceedings Eurographics/IEEE VGTC Symposium Point-Based Graphics (2005)
Stony Brook, NY, USA
June 20, 2005 to June 21, 2005
J. Rovira , Inst. d'Informatica i Aplicacions, Univ. de Girona, Spain
In this paper we address the problem of extracting representative point samples from polygonal models. The goal of such a sampling algorithm is to find points that are evenly distributed. We propose star-discrepancy as a measure for sampling quality and propose new sampling methods based on global line distributions. We investigate several line generation algorithms including an efficient hardware-based sampling method. Our method contributes to the area of point-based graphics by extracting points that are more evenly distributed than by sampling with current algorithms.
realism, feature extraction, point sampling, polygonal model, star-discrepancy, global line distribution, line generation algorithm, three-dimensional graphics
J. Rovira, P. Wonka, F. Castro, M. Sbert, "Point sampling with uniformly distributed lines", Proceedings Eurographics/IEEE VGTC Symposium Point-Based Graphics, vol. 00, no. , pp. 109-118, 2005, doi:10.1109/PBG.2005.194071