The Community for Technology Leaders
2014 Sixth International Symposium on Parallel Architectures, Algorithms and Programming (PAAP) (2014)
Beijing, China
July 13, 2014 to July 15, 2014
ISSN: 2168-3034
ISBN: 978-1-4799-3844-5
pp: 81-86
ABSTRACT
We present new parallel algorithms for testing pattern involvement for all length 4 permutations. Our algorithmshave the complexity of O(log n) time with n/log nprocessors on the CREW PRAM model, O(logloglog n) timewith n/logloglog n processors or constant time and nlog3 nprocessors on a CRCW PRAM model. Parallel algorithms werenot designed before for some of these patterns and for otherpatters the previous best algorithms require O(log n) time and n processors on the CREW PRAM model.
INDEX TERMS
Program processors, Arrays, Phase change random access memory, Silicon, Indexes, Parallel algorithms, Testing
CITATION
Yijie Han, Sanjeev Saxena, "Parallel Algorithms for Testing Length Four Permutations", 2014 Sixth International Symposium on Parallel Architectures, Algorithms and Programming (PAAP), vol. 00, no. , pp. 81-86, 2014, doi:10.1109/PAAP.2014.46
95 ms
(Ver 3.3 (11022016))