The Community for Technology Leaders
2014 Sixth International Symposium on Parallel Architectures, Algorithms and Programming (PAAP) (2014)
Beijing, China
July 13, 2014 to July 15, 2014
ISSN: 2168-3034
ISBN: 978-1-4799-3844-5
pp: 81-86
ABSTRACT
We present new parallel algorithms for testing pattern involvement for all length 4 permutations. Our algorithmshave the complexity of O(log n) time with n/log nprocessors on the CREW PRAM model, O(logloglog n) timewith n/logloglog n processors or constant time and nlog3 nprocessors on a CRCW PRAM model. Parallel algorithms werenot designed before for some of these patterns and for otherpatters the previous best algorithms require O(log n) time and n processors on the CREW PRAM model.
INDEX TERMS
Program processors, Arrays, Phase change random access memory, Silicon, Indexes, Parallel algorithms, Testing,parallel algorithms, Separable permutations, length 4 permutations, pattern matching
CITATION
Yijie Han, Sanjeev Saxena, "Parallel Algorithms for Testing Length Four Permutations", 2014 Sixth International Symposium on Parallel Architectures, Algorithms and Programming (PAAP), vol. 00, no. , pp. 81-86, 2014, doi:10.1109/PAAP.2014.46
91 ms
(Ver 3.3 (11022016))