The Community for Technology Leaders
2009 10th International Workshop on Microprocessor Test and Verification (2009)
Austin, TX
Dec. 7, 2009 to Dec. 9, 2009
ISSN: 1550-4093
ISBN: 978-1-4244-6479-1
TABLE OF CONTENTS

[Front cover] (PDF)

pp. C1

[Title page iii] (PDF)

pp. iii

Table of contents (PDF)

pp. v-vi

Preface (PDF)

pp. vii

Acknowledgements (PDF)

pp. viii

list-reviewer (PDF)

pp. xi

An ILP-Based Diagnosis Framework for Multiple Open-Segment Defects (Abstract)

Chen-Yuan Kao , Nat. Chiao Tung Univ., Hsinchu, Taiwan
Chien-Hui Liao , Nat. Chiao Tung Univ., Hsinchu, Taiwan
Charles H.-P Wen , Nat. Chiao Tung Univ., Hsinchu, Taiwan
pp. 69-72

Author index (PDF)

pp. 114

[Roster] (PDF)

pp. 116
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