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Memory Technology, Design and Testin, IEEE International Workshop on (2007)
Taipei, Taiwan
Dec. 3, 2007 to Dec. 5, 2007
ISBN: 978-1-4244-1656-1
TABLE OF CONTENTS
Papers

Workshop schedule (PDF)

pp. 73-75

High-performance SRAM in nanoscale CMOS: Design challenges and techniques (Abstract)

Saibal Mukhopadhyay , IBM T. J. Watson Research Center, Yorktown Heights, NY 10598, U. S. A.
Jae-Joon Kim , IBM T. J. Watson Research Center, Yorktown Heights, NY 10598, U. S. A.
Rahul Rao , IBM T. J. Watson Research Center, Yorktown Heights, NY 10598, U. S. A.
Ching-Te Chuang , IBM T. J. Watson Research Center, Yorktown Heights, NY 10598, U. S. A.
Keunwoo Kim , IBM T. J. Watson Research Center, Yorktown Heights, NY 10598, U. S. A.
pp. 4-12

Scaling trend of the Flash memory for file storage (Abstract)

Riichiro Shirota , Tsing Hua University in China
pp. 16

Future trend of flash memories (Abstract)

Yi-Chou Chen , Emerging Central Lab. of Macronix International Co. Ltd., Taiwan
Rich Liu , Emerging Central Lab. of Macronix International Co. Ltd., Taiwan
pp. 17-18

Embedded SRAM trend in nano-scale CMOS (Abstract)

Hiroyuki Yamauchi , Faculty of Information Engineering, Dept. of Computer Science and Engineering, Fukuoka Institute of Technology, 3-30-1, Wajiro-Higashi, Higashi-ku, 811-0295, Japan
pp. 19-22

Process variability considerations in the design of an eSRAM (Abstract)

M. Bastian , INFINEON TECHNOLOGIES, Sophia Antipolis, France
P. Maurine , LIRMM, Montpellier, France
M. Yap San Min , LIRMM, Montpellier, France
M. Robert , LIRMM, Montpellier, France
pp. 23-26

A Controllable low-power dual-port embedded SRAM for DSP processor (Abstract)

Wei Hwang , Department of Electronics Engineering&Institute of Electronics, Microelectronics and Information System Research Center (MIRC), National Chiao-Tung University, Hsin-Chu 300, Ta
Tay-Jyi Lin , Department of Electronics Engineering&Institute of Electronics, Microelectronics and Information System Research Center (MIRC), National Chiao-Tung University, Hsin-Chu 300, Ta
Siang-Sen Deng , Department of Electronics Engineering&Institute of Electronics, Microelectronics and Information System Research Center (MIRC), National Chiao-Tung University, Hsin-Chu 300, Ta
Chih-Wei Liu , Department of Electronics Engineering&Institute of Electronics, Microelectronics and Information System Research Center (MIRC), National Chiao-Tung University, Hsin-Chu 300, Ta
Ming-Hung Chang , Department of Electronics Engineering&Institute of Electronics, Microelectronics and Information System Research Center (MIRC), National Chiao-Tung University, Hsin-Chu 300, Ta
Hao-I Yang , Department of Electronics Engineering&Institute of Electronics, Microelectronics and Information System Research Center (MIRC), National Chiao-Tung University, Hsin-Chu 300, Ta
Shih-Hao Ou , Department of Electronics Engineering&Institute of Electronics, Microelectronics and Information System Research Center (MIRC), National Chiao-Tung University, Hsin-Chu 300, Ta
pp. 27-30

How far can we go in wireless testing of memory chips and wafers? (Abstract)

Cheng-Wen Wu , SOC Technology Center (STC), Industrial Technology Research Institute (ITRI), China
pp. 31-32

RAMSES-D: DRAM fault simulator supporting weighted coupling fault (Abstract)

Yu-Tsao Hsing , Department of Electrical Engineering, National Tsing Hua University, Hsinchu, Taiwan
Cheng-Wen Wu , Department of Electrical Engineering, National Tsing Hua University, Hsinchu, Taiwan
Song-Guang Wu , Department of Electrical Engineering, National Tsing Hua University, Hsinchu, Taiwan
pp. 33-38

Resilient SRAM design using BIST-assisted Timing Tracking (Abstract)

Ya-Chun Lai , Department of Electrical Engineering, National Tsing Hua University, Hsinchu, Taiwan
Shi-Yu Huang , Department of Electrical Engineering, National Tsing Hua University, Hsinchu, Taiwan
pp. 39-41

Power-gating current test for static RAM in nanotechnologies (Abstract)

Hsin-Ling Chen , Department of Electronic Engineering, National Changhua University of Education, Taiwan
Tsung-Chu Huang , Department of Electronic Engineering, National Changhua University of Education, Taiwan
Yuan-Wei Chao , Department of Electronic Engineering, National Changhua University of Education, Taiwan
Chih-Jong Chen , Department of Electronic Engineering, National Changhua University of Education, Taiwan
pp. 42-45

An automatic design for flash memory testing (Abstract)

Zheng-Wei Song , Department of Computer Science and Information Engineering, Cheng Shiu University, Kaohsiung County, Taiwan
Wei-Lun Wang , Department of Computer Science and Information Engineering, Cheng Shiu University, Kaohsiung County, Taiwan
pp. 46-49

Next-generation non-volatile memory (Abstract)

Ming-Jer Kao , Nanoelectronic Technology Division, Taiwan
pp. 50

The polarity dependence of ONO thickness for wrapped-select-gate (WSG) SONOS memory (Abstract)

Kuan-Ti Wang , Department of Electrophysics, National Chiao Tung University, 1001 Ta Hsueh Rd, Hsinchu, Taiwan
Woei-Cherng Wu , Department of Electrophysics, National Chiao Tung University, 1001 Ta Hsueh Rd, Hsinchu, Taiwan
Chao-Sung Lai , Department of Electronic Engineering, Chang Gung University, 259 Wen-Hwa 1st Road, Kwei-Shan, Tao-Yuan, Taiwan
Tien-Sheng Chao , Department of Electrophysics, National Chiao Tung University, 1001 Ta Hsueh Rd, Hsinchu, Taiwan
pp. 51-54

A novel poly-Si nanowire TFT for nonvolatile memory applications (Abstract)

Jian-Fu Huang , Department of Electronics Engineering and Institute of Electronics, National Chiao Tung University, 1001 Ta Hsueh Road, Hsinchu, 300, China
Hsin-Hwei Hsu , Department of Electronics Engineering and Institute of Electronics, National Chiao Tung University, 1001 Ta Hsueh Road, Hsinchu, 300, China
Tiao-Yuan Huang , Department of Electronics Engineering and Institute of Electronics, National Chiao Tung University, 1001 Ta Hsueh Road, Hsinchu, 300, China
Horng-Chih Lin , Department of Electronics Engineering and Institute of Electronics, National Chiao Tung University, 1001 Ta Hsueh Road, Hsinchu, 300, China
pp. 55-56

Improving the speed and power of compilable SRAM using dual-mode self-timed technique (Abstract)

Shu-Meng Yang , Department of Electrical Engineering, National Tsing Hua University, Hsinchu, Taiwan
Robin Lee , Design Technology Platform, Taiwan Semiconductor Manufacturing Company, Hsinchu, Taiwan
Meng-Fan Chang , Department of Electrical Engineering, National Tsing Hua University, Hsinchu, Taiwan
Kuang-Ting Chen , Department of Electrical Engineering, National Tsing Hua University, Hsinchu, Taiwan
Hung-Jen Liao , Design Technology Platform, Taiwan Semiconductor Manufacturing Company, Hsinchu, Taiwan
pp. 57-60

Vulnerability analysis of secure USB flash drives (Abstract)

Yunho Lee , Information Security Group, Sungkyunkwan University, 300 Cheoncheon-dong, Jangan-gu, Suwon, Gyeonggi-do, 440-746, Korea
Seungjoo Kim , Information Security Group, Sungkyunkwan University, 300 Cheoncheon-dong, Jangan-gu, Suwon, Gyeonggi-do, 440-746, Korea
Fei Yang , Information Security Group, Sungkyunkwan University, 300 Cheoncheon-dong, Jangan-gu, Suwon, Gyeonggi-do, 440-746, Korea
Younsung Choi , Information Security Group, Sungkyunkwan University, 300 Cheoncheon-dong, Jangan-gu, Suwon, Gyeonggi-do, 440-746, Korea
Dongho Won , Information Security Group, Sungkyunkwan University, 300 Cheoncheon-dong, Jangan-gu, Suwon, Gyeonggi-do, 440-746, Korea
Hanjae Jeong , Information Security Group, Sungkyunkwan University, 300 Cheoncheon-dong, Jangan-gu, Suwon, Gyeonggi-do, 440-746, Korea
Woongryel Jeon , Information Security Group, Sungkyunkwan University, 300 Cheoncheon-dong, Jangan-gu, Suwon, Gyeonggi-do, 440-746, Korea
pp. 61-64

Logic-compatible embedded NVM for RFID application (Abstract)

Yu-Der Chih , Design Service Division, Taiwan Semiconductor Manufacturing Company, Ltd., Taiwan
Der-Shin Shyu , Design Service Division, Taiwan Semiconductor Manufacturing Company, Ltd., Taiwan
C.H. Kuo , Design Service Division, Taiwan Semiconductor Manufacturing Company, Ltd., Taiwan
J.C. Wang , Design Service Division, Taiwan Semiconductor Manufacturing Company, Ltd., Taiwan
Jim Huang , Design Service Division, Taiwan Semiconductor Manufacturing Company, Ltd., Taiwan
T.Y. Yew , Design Service Division, Taiwan Semiconductor Manufacturing Company, Ltd., Taiwan
James Wang , Design Service Division, Taiwan Semiconductor Manufacturing Company, Ltd., Taiwan
Kyle Liu , Design Service Division, Taiwan Semiconductor Manufacturing Company, Ltd., Taiwan
pp. 65-66

An ALU cluster intellectual property for magnetic RAM media applications platform (Abstract)

Herming Chiueh , Department of Communication Engineering, National Chiao Tung University, HsinChu, Taiwan
Chia-Yi Liou , Department of Communication Engineering, National Chiao Tung University, HsinChu, Taiwan
pp. 67-70

Author index (PDF)

pp. 71
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