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Memory Technology, Design and Testin, IEEE International Workshop on (2006)
Taipei, Taiwan
Aug. 2, 2006 to Aug. 4, 2006
ISSN: 1087-4852
ISBN: 0-7695-2572-5
TABLE OF CONTENTS

list-reviewer (PDF)

pp. xi
Introduction

Foreword (PDF)

pp. viii
Reception Talk

DRAM Industry Trend (PDF)

Pei-Lin Pai , Nanya Technology Corp., Taiwan
pp. xii
Keynote Speech 1

Roadmap of the Flash Memory (PDF)

Riichiro Shirota , Toshiba, Japan
pp. xiii
Keynote Speech 2
Invited Talk 1
Invited Talk 2
Invited Talk 3
Embedded Tutorial

High-Quality Memory Test (PDF)

Mohamed Azimane , Philips, The Netherlands
pp. xviii
Session T1: Memory Diagnosis & Repair

Fault-Pattern Oriented Defect Diagnosis for Flash Memory (Abstract)

Mu-Hsien Hsu , National Tsing Hua University Hsinchu, Taiwan
Yu-Tsao Hsing , National Tsing Hua University Hsinchu, Taiwan
Cheng-Wen Wu , National Tsing Hua University Hsinchu, Taiwan
Jen-Chieh Yeh , National Tsing Hua University Hsinchu, Taiwan
pp. 3-8

A March-Based Algorithm for Location and Full Diagnosis of All Unlinked Static Faults (Abstract)

T.A. Gyonjyan , Yerevan State University, Armenia
V.A. Vardanian , Virage Logic, Armenia
G. Harutunyan , Virage Logic, Armenia
pp. 9-14

Improved Representatives for Unrepairability Judging and Economic Repair Solutions of Memories (Abstract)

Hsing-Chung Liang , Chung Yung Christian Univ., Taiwan, R.O.C.
Le-Quen Tzeng , Chung Yung Christian Univ., Taiwan, R.O.C.
pp. 15
Session T2: Memory Device & Organization

A New 1T DRAM Cell With Enhanced Floating Body Ef (Abstract)

Jyi-Tsong Lin , National Sun Yat Sen University
Mike Chang , National Sun Yat Sen University
pp. 23-27

FlexiVia ROM Compiler Programmable on Different Via Layers Based on Top Metal Assignment (Abstract)

Ding-Sheng Chen , Intellectual Property Library Company Hsinchu, Taiwan
Yung-Fa Chou , National Tsing Hua Univerity Hsinchu, Taiwan
Meng-Fan Chang , Intellectual Property Library Company Hsinchu, Taiwan
Chia-Hsin Lee , Intellectual Property Library Company Hsinchu, Taiwan
Shiao-Yi Lin , Intellectual Property Library Company Hsinchu, Taiwan
Yu-Ling Sung , Intellectual Property Library Company Hsinchu, Taiwan
Yu-Zhen Liao , Intellectual Property Library Company Hsinchu, Taiwan
Su-Meng Yang , Intellectual Property Library Company Hsinchu, Taiwan
Min-Chung Hsu , Intellectual Property Library Company Hsinchu, Taiwan
Hsin-Kun Hsu , Intellectual Property Library Company Hsinchu, Taiwan
Ding-Ming Kwai , Intellectual Property Library Company Hsinchu, Taiwan
pp. 28-33

Novel Memory Organization and Circuit Designs for Efficient Data Access in Applications of 3D Graphics and Multimedia Coding (Abstract)

Tze-Chong Cheng , National Sun Yat-sen University, Taiwan
Shen-Fu Hsiao , National Sun Yat-sen University, Taiwan
Yo-Chi Chen , National Sun Yat-sen University, Taiwan
Ming-Yu Tsai , National Sun Yat-sen University, Taiwan
pp. 34-42
Session V2: Memory Design and Testing (Invited)

MRAM Write Error Categorization with QCKB (Abstract)

Tadashi Kai , Toshiba Corporation, Japan
Hisanori Aikawa , Toshiba Corporation, Japan
Kenji Tsuchida , Toshiba Corporation, Japan
Yoshiaki Asao , Toshiba Corporation, Japan
Yoshihisa Iwata , Toshiba Corporation, Japan
Keiji Hosotani , Toshiba Corporation, Japan
Yuui Shimizu , Toshiba Corporation, Japan
Yoshihiro , Toshiba Corporation, Japan
Naoharu Shimomura , Toshiba Corporation, Japan
Sumio Ikegawa , Toshiba Corporation, Japan
pp. 43-48

DDR2 DRAM Output Timing Optimization (Abstract)

Bret Johnson , Qimonda
Marcin Gnat , Qimonda
Juerg Schwizer , Qimonda
Ralf Schneider , Qimonda
Joerg Vollrath , Qimonda
pp. 49-54

Dynamic Data Stability in SRAM Cells and Its Implications on Data Stability Tests (Abstract)

M. Sharifkhani , University of Waterloo, 200 University West Ave., Waterloo, Ontario, Canada
M. Sachdev , University of Waterloo, 200 University West Ave., Waterloo, Ontario, Canada
S. M. Jahinuzzaman , University of Waterloo, 200 University West Ave., Waterloo, Ontario, Canada
pp. 55-64
Session T3: Flash & SRAM Characterization

SRAM Cell Current in Low Leakage Design (Abstract)

Min-Chung Hsu , Intellectual Property Library Company Hsinchu, Taiwan
Yung-Fa Chou , National Tsing Hua University Hsinchu, Taiwan
Yu-Ling Sung , Intellectual Property Library Company Hsinchu, Taiwan
Meng-Fan Chang , Intellectual Property Library Company Hsinchu, Taiwan
Chung-Ping Kuo , Intellectual Property Library Company Hsinchu, Taiwan
Chia-Hsin Lee , Intellectual Property Library Company Hsinchu, Taiwan
Hsien-Yu Pan , Intellectual Property Library Company Hsinchu, Taiwan
Chi-Hsien Chuang , Intellectual Property Library Company Hsinchu, Taiwan
Ding-Ming Kwai , Intellectual Property Library Company Hsinchu, Taiwan
Ching-Hua Hsiao , National Chiao Tung University Hsinchu, Taiwan
Yi-Chun Chen , Intellectual Property Library Company Hsinchu, Taiwan
pp. 65-70

On the Combined Impact of Soft and Medium Gate Oxide Breakdown and Process Variability on the Parametric Figures of SRAM components (Abstract)

Francky Catthoor , KUL, Leuven, Belgium
Miguel Miranda , IMEC, Leuven, Belgium
Hua Wang , Katholieke Univ. Leuven, Belgiu
Wim Dehaene , Katholieke Univ. Belgium
pp. 71-76

Detailed Comparisons of Program, Erase and Data Retention Characteristics between P+- and N+-Poly SONOS NAND Flash Memory (Abstract)

Chih-Ming Chao , Powerchip Semiconductor Corp., Science Based Industrial Park, Taiwan
Hann-Ping Hwang , Powerchip Semiconductor Corp., Science Based Industrial Park, Taiwan
Saysamone Pittikoun , Powerchip Semiconductor Corp., Science Based Industrial Park, Taiwan
Liang-Tai Kuo , Powerchip Semiconductor Corp., Science Based Industrial Park, Taiwan
Chih-Kai Kang , Powerchip Semiconductor Corp., Science Based Industrial Park, Taiwan
Victor Chao-Wei Kuo , Powerchip Semiconductor Corp., Science Based Industrial Park, Taiwan
Tzung-Bin Huang , Powerchip Semiconductor Corp., Science Based Industrial Park, Taiwan
Shi-Hsien Chen , Powerchip Semiconductor Corp., Science Based Industrial Park, Taiwan
Li-Wei Liu , Powerchip Semiconductor Corp., Science Based Industrial Park, Taiwan
Houng-Chi Wei , Powerchip Semiconductor Corp., Science Based Industrial Park, Taiwan
pp. 77-79

Comparison of Electrical and Reliability Characteristics of Different Tunnel Oxides in SONOS Flash Memory (Abstract)

Travis Cho , Powerchip Semiconductor Corporation, HsinChu 300, Taiwan ROC
Hua-Ching Chien , National Defense University, Tahsi, Taoyuan
Jia-Lin Wu , National Defense University, Tahsi, Taoyuan
Cheng-Yen Wu , National Defense University, Tahsi, Taoyuan
Chin-Hsing Kao , National Defense University, Tahsi, Taoyuan
Chien-Wei Liao , National Defense University, Tahsi, Taoyuan
Saysamone Pittikoun , Powerchip Semiconductor Corporation, HsinChu 300, Taiwan ROC
Houng-Chi Wei , Powerchip Semiconductor Corporation, HsinChu 300, Taiwan ROC
Hann-Ping Hwang , Powerchip Semiconductor Corporation, HsinChu 300, Taiwan ROC
Chih-Yuan Lee , National Defense University, Tahsi, Taoyuan
Shih-Hsien Chen , Powerchip Semiconductor Corporation, HsinChu 300, Taiwan ROC
pp. 80-84
Author Index

Author Index (PDF)

pp. 85
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