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Memory Technology, Design and Testin, IEEE International Workshop on (2004)
San Jose, California, USA
Aug. 9, 2004 to Aug. 10, 2004
ISSN: 1087-4852
ISBN: 0-7695-2193-2
TABLE OF CONTENTS
Introduction
Session 1: Special Session

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Session 2: Fast ECC and Efficient Cache Controllers

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Fast Error-Correcting Circuits for Fault-Tolerant Memory (Abstract)

Elaine Ou , Harvard University
Woodward Yang , Harvard University
pp. 8-12

Tag Skipping Technique Using WTS Buffer for Optimal Low Power Cache Design (Abstract)

Jaafar Alghazo , Southern Illinois University at Carbondale
Adil Akaaboune , Southern Illinois University at Carbondale
Nazeih Botros , Southern Illinois University at Carbondale
pp. 13-18

SF-LRU Cache Replacement Algorithm (Abstract)

Adil Akaaboune , Southern Illinois University at Carbondale
Nazeih Botros , Southern Illinois University at Carbondale
Jaafar Alghazo , Southern Illinois University at Carbondale
pp. 19-24
Session 3: Memory Fault Coverage and Test Analysis

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The Effectiveness of the Scan Test and Its New Variants (Abstract)

Said Hamdioui , Delft University of Technology
Ad J. van de Goor , Delft University of Technology
Zaid Al-Ars , Delft University of Technology
pp. 26-31

Influence of Bit Line Twisting on the Faulty Behavior of DRAMs (Abstract)

Ad J. van de Goor , Delft University of Technology
Zaid Al-Ars , CatRam Solutions, Delft University of Technology and Infineon Technologies
Martin Herzog , Infineon Technologies
Ivo Schanstra , Infineon Technologies
pp. 32-37

Markov Models of Fault-Tolerant Memory Systems under SEU (Abstract)

Luca Schiano , Northeastern University
Fabrizio Lombardi , Northeastern University
Marco Ottavi , Northeastern University
pp. 38-43
Session 4: Special Session

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Session 5: Embedded Memory Test Trends and Future

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The State-of-Art and Future Trends in Testing Embedded Memories (Abstract)

Georgi Gaydadjiev , Delft University of Technology
Said Hamdioui , Delft University of Technology
Ad J. van de Goor , Delft University of Technology
pp. 54-59

Built-in Self-Test and Repair (BISTR) Techniques for Embedded RAMs (Abstract)

Shyue-Kung Lu , Fu Jen Catholic University
Shih-Chang Huang , Fu Jen Catholic University
pp. 60-64

A Parallel Built-in Diagnostic Scheme for Multiple Embedded Memories (Abstract)

Cheng-Wen Wu , National Tsing Hua University
Wen-Ching Wu , Industrial Technology Research Institute
Yeong-Jar Chang , Industrial Technology Research Institute
Li-Ming Denq , National Tsing Hua University
Rei-Fu Huang , National Tsing Hua University
pp. 65-69
Session 6: Industrial Practices on BIST, BISD and BISR

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Micro Programmable Built-In Self Repair for SRAMs (Abstract)

L. Albani , STMicroelectronics
M. Crestan , STMicroelectronics
D. Rimondi , STMicroelectronics
R. Zappa , STMicroelectronics
G. Mastrodomenico , STMicroelectronics
C. Selva , STMicroelectronics
C. Torelli , STMicroelectronics
pp. 72-77

A Programmable Built-in Self-Diagnosis for Embedded SRAM (Abstract)

Stefano Corbani , STMicroelectronics
Giovanni Mastrodomenico , STMicroelectronics
Lara Albani , STMicroelectronics
Danilo Rimondi , STMicroelectronics
Rita Zappa , STMicroelectronics
Cosimo Torelli , STMicroelectronics
Carolina Selva , STMicroelectronics
pp. 84-89
Session 7: EDA Solutions to Test and Repair Memories

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An Integrated Memory Self Test and EDA Solution (Abstract)

Dwayne Burek , Magma Design Automation
R. Dean Adams , Magma Design Automation
Robert Abbott , Magma Design Automation
Eric MacDonald , University of Texas at El Paso
Xiaoliang Bai , Magma Design Automation
pp. 92-95

A BIST Algorithm for Bit/Group Write Enable Faults in SRAMs (Abstract)

Saman Adham , LogicVision, Inc.
Benoit Nadeau-Dostie , LogicVision, Inc.
pp. 98-101
Session 8: Making Memories More Reliable

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Embedded Memory Reliability: The SER Challenge (Abstract)

V. A. Vardanian , Virage Logic Corporation
N. Derhacobian , Virage Logic Corporation
Y. Zorian , Virage Logic Corporation
pp. 104-110

Do We Need Anything More Than Single Bit Error Correction (ECC)? (Abstract)

Michael Spica , Intel Corporation
TM Mak , Intel Corporation
pp. 111-116

Redundancy & It?s Not Just for Defects Anymore (Abstract)

Rob Aitken , Artisan Components
pp. 117-120
Author Index

Author Index (PDF)

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