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Software Metrics, IEEE International Symposium on (2002)
Ottawa, Canada
June 4, 2002 to June 7, 2002
ISBN: 0-7695-1339-5
pp: 249
Forrest Shull , Fraunhofer Center for Experimental Software Engineering, Maryland
Vic Basili , Fraunhofer Center for Experimental Software Engineering, Maryland and University of Maryland
Barry Boehm , University of Southern California
A.Winsor Brown , University of Southern California
Patricia Costa , Fraunhofer Center for Experimental Software Engineering, Maryland
Mikael Lindvall , Fraunhofer Center for Experimental Software Engineering, Maryland
Dan Port , University of Southern California
Ioana Rus , Fraunhofer Center for Experimental Software Engineering, Maryland
Roseanne Tesoriero , Fraunhofer Center for Experimental Software Engineering, Maryland
Marvin Zelkowitz , Fraunhofer Center for Experimental Software Engineering, Maryland and University of Maryland
ABSTRACT
<p>The Center for Empirically Based Software Engineering helps improve software development by providing guidelines for selecting development techniques, recommending areas for further research, and supporting software engineering education. A central activity toward achieving this goal has been the running of "eWorkshops" that capture expert knowledge with a minimum of overhead effort to formulate heuristics on a particular topic. The resulting heuristics are a useful summary of the current state of knowledge in an area based on expert opinion.</p> <p>This paper discusses the results to date of a series of eWorkshops on software defect reduction. The original discussion items are presented along with an encapsulated summary of the expert discussion. The reformulated heuristics can be useful both to researchers (for pointing out gaps in the current state of the knowledge requiring further investigation) and to practitioners (for benchmarking or setting expectations about development practices). The heuristics will be further refined during a physical expert workshop at the 2002 Metrics Symposium.</p>
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CITATION

F. Shull et al., "What We Have Learned About Fighting Defects," Software Metrics, IEEE International Symposium on(METRICS), Ottawa, Canada, 2002, pp. 249.
doi:10.1109/METRIC.2002.1011343
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