The Community for Technology Leaders
2017 IEEE/ACM 2nd International Workshop on Metamorphic Testing (MET) (2017)
Buenos Aires, Argentina
May 22, 2017 to May 22, 2017
ISBN: 978-1-5386-0424-3
TABLE OF CONTENTS

[Title page iii] (PDF)

pp. iii

Table of contents (PDF)

pp. v-vi

Author index (PDF)

pp. 42
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