The Community for Technology Leaders
2016 IEEE/ACM 1st International Workshop on Metamorphic Testing (2016)
Austin, Texas, USA
May 16, 2016 to May 16, 2016
ISBN: 978-1-4503-4163-9
TABLE OF CONTENTS

[Title page iii] (PDF)

pp. iii

Table of contents (PDF)

pp. v-vi

Committees (PDF)

pp. viii

Author index (PDF)

pp. 48
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