The Community for Technology Leaders
2013 14th Latin American Test Workshop - LATW (2013)
Cordoba, Argentina Argentina
Apr. 3, 2013 to Apr. 5, 2013
ISBN: 978-1-4799-0595-9
TABLE OF CONTENTS
Papers

Diagnostic modeling of digital systems with low- and high-level decision diagrams (PDF)

Raimund Ubar , Computer Engineering Department, Tallinn University of Technology, Estonia
pp. 1

Pre-characterization procedure for a mixed mode simulation of IR-drop induced delays (PDF)

B. Becker , Albert-Ludwigs-University, Georges-Köhler Allee 51 79110, Freiburg Germany
F. Azais , University of Montpellier, LIRMM, 161 rue Ada 34095, France
M. Comte , University of Montpellier, LIRMM, 161 rue Ada 34095, France
I. Polian , University of Passau, Faculty of Comp. Science & Mathematics, Innstr. 43D 94032, Germany
M. Renovell , University of Montpellier, LIRMM, 161 rue Ada 34095, France
M. Aparicio , University of Montpellier, LIRMM, 161 rue Ada 34095, France
J. Jiang , University of Passau, Faculty of Comp. Science & Mathematics, Innstr. 43D 94032, Germany
pp. 1-6
Papers

Improving error detection with selective redundancy in software-based techniques (PDF)

Raul S. Barth , Instituto de Informática, Universidade Federal do Rio Grande do Sul, Porto Alegre, Brazil
Jose R. Azambuja , Instituto de Informática, Universidade Federal do Rio Grande do Sul, Porto Alegre, Brazil
Fernanda L. Kastensmidt , Instituto de Informática, Universidade Federal do Rio Grande do Sul, Porto Alegre, Brazil
Eduardo Chielle , Instituto de Informática, Universidade Federal do Rio Grande do Sul, Porto Alegre, Brazil
pp. 1-6

Comparison of fault-tolerant fabless CLBs in SRAM-based FPGAs (PDF)

Lirida Naviner , Institut TELECOM, TELECOM ParisTech, LTCI-CNRS France
Philippe Matherat , Institut TELECOM, TELECOM ParisTech, LTCI-CNRS France
Arwa Ben Dhia , Institut TELECOM, TELECOM ParisTech, LTCI-CNRS France
pp. 1-6

Analyzing and quantifying fault tolerance properties (PDF)

Sybille Hellebrand , Institute of Electrical Engineering and Information Technology, University of Paderborn, Germany
pp. 1

Automatic property generation for formal verification applied to HDL-based design of an on-board computer for space applications (PDF)

Wesley Silva , Computer Science Department, Federal University of Santa Catarina, Florianópolis, Brazil
Djones Lettnin , Eletrical Engineering Department, Federal University of Santa Catarina, Florianópolis, Brazil
Eduardo Bezerra , Eletrical Engineering Department, Federal University of Santa Catarina, Florianópolis, Brazil
Markus Winterholer , Cadence Design Systems, Mozartstr.2, 85622 Feldkirchen - Germany
pp. 1-6

PrOCov: Probabilistic output coverage model (PDF)

Joel Ivan Munoz Quispe , Department of Electronic Systems, School of Engineering, University of Sao Paulo, Brazil
Wang Jiang Chau , Department of Electronic Systems, School of Engineering, University of Sao Paulo, Brazil
Marius Strum , Department of Electronic Systems, School of Engineering, University of Sao Paulo, Brazil
pp. 1-6

Assessment of diagnostic test for automated bug localization (PDF)

Valentin Tihhomirov , Department of Computer Engineering, Tallinn University of Technology, ESTONIA
Raimund Ubar , Department of Computer Engineering, Tallinn University of Technology, ESTONIA
Jaan Raik , Department of Computer Engineering, Tallinn University of Technology, ESTONIA
Maksim Jenihhin , Department of Computer Engineering, Tallinn University of Technology, ESTONIA
Anton Tsepurov , Department of Computer Engineering, Tallinn University of Technology, ESTONIA
pp. 1-6

Local data fusion algorithm for fire detection through mobile robot (PDF)

Guilherme Freire Roberto , UNESP - Universidade Estadual Paulista, Sao Jose do Rio Preto, Sao Paulo, Brazil
A.R. Pinto , UNESP - Universidade Estadual Paulista, Sao Jose do Rio Preto, Sao Paulo, Brazil
J.M. Machado , UNESP - Universidade Estadual Paulista, Sao Jose do Rio Preto, Sao Paulo, Brazil
Kalinka Castelo Branco , USP - Universidade de Sao Paulo, Sao Carlos, Brazil
pp. 1-6

Parametric model calibration and measurement extraction for LFN using virtual instrumentation (PDF)

Manuel Jimenez , Electrical and Computer Engineering Department, University of Puerto Rico at Mayaguez, Puerto Rico
pp. 1-6

Low cost signal reconstruction based testing of RF components using incoherent undersampling (PDF)

Aritra Banerjee , School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, USA
Debesh Bhatta , School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, USA
Abhijit Chatterjee , School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, USA
Sabyasachi Deyati , School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, USA
Nicholas Tzou , School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, USA
pp. 1-5

Bridge defect detection in nanometer CMOS circuits using Low VDD and body bias (PDF)

Sebastia Bota , GSE-UIB, University of Balearic Islands, Mallorca, Spain
Hector Villacorta , National Institute for Astrophysics, Optics and Electronics - INAOE, Mexico
Jaime Martinez , Universidad Veracruzana, MICRONA, Mexico
Victor Champac , National Institute for Astrophysics, Optics and Electronics - INAOE, Mexico
Jaume Segura , GSE-UIB, University of Balearic Islands, Mallorca, Spain
Jose Garcia-Gervacio , Universidad Veracruzana, MICRONA, Mexico
pp. 1-6

Memristor-based filtering applications (PDF)

Fernando Corinto , Department of Electronics and Telecommunications, Politecnico di Torino, Italy
Marco Gilli , Department of Electronics and Telecommunications, Politecnico di Torino, Italy
Alon Ascoli , Faculty of Electronics and Electrotechnics, Technische Universität Dresden, Germany
Miroslav Mirchev , Department of Electronics and Telecommunications, Politecnico di Torino, Italy
R. Tetzlaff , Faculty of Electronics and Electrotechnics, Technische Universität Dresden, Germany
pp. 1-6

Vertically-stacked silicon nanowire transistors with controllable polarity: A robustness study (PDF)

Pierre-Emmanuel Gaillardon , Integrated Systems Laboratory, EPFL, Lausanne, Switzerland
Giovanni De Micheli , Integrated Systems Laboratory, EPFL, Lausanne, Switzerland
Hassan Ghasemzadeh , Integrated Systems Laboratory, EPFL, Lausanne, Switzerland
pp. 1-6

Investigating the behavior of physical defects in pn-junction based reconfigurable graphene devices (PDF)

Sandeep Miryala , Politecnico di Torino, 10129, Italy
Andrea Calimera , Politecnico di Torino, 10129, Italy
Enrico Macii , Politecnico di Torino, 10129, Italy
Massimo Poncino , Politecnico di Torino, 10129, Italy
Leticia Bolzani Poehls , Catholic University of Rio Grande do Sul, 90619-900, Porto Alegre, Brazil
pp. 1-6

Towards an automatic generation of diagnostic in-field SBST for processor components (PDF)

Mario Scholzel , Computer Engineering Group, Brandenburg University of Technology, Cottbus, Germany
Tobias Koal , Computer Engineering Group, Brandenburg University of Technology, Cottbus, Germany
Stephanie Roder , Computer Engineering Group, Brandenburg University of Technology, Cottbus, Germany
Heinrich Theodor Vierhaus , Computer Engineering Group, Brandenburg University of Technology, Cottbus, Germany
pp. 1-6

ISA configurability of an FPGA test-processor used for board-level interconnection testing (PDF)

J.-H. Meza Escobar , Integrated Communication Systems Group, Ilmenau University of Technology, Germany
J. Sachsse , Integrated Communication Systems Group, Ilmenau University of Technology, Germany
S. Ostendorff , Integrated Communication Systems Group, Ilmenau University of Technology, Germany
H.-D. Wuttke , Integrated Communication Systems Group, Ilmenau University of Technology, Germany
pp. 1-6

Embedded tutorial: Regaining hardware security and trust (PDF)

Ozgur Sinanoglu , Center for Interdisciplinary Studies in Security and Privacy, New York University Abu Dhabi, United Arab Emirates
pp. 1

Fast fault injection techniques using FPGAs (PDF)

Luis Entrena , Electronic Technology Department, Universidad Carlos III de Madrid, Spain
pp. 1

Effect of aging on power integrity of digital integrated circuits (PDF)

A. Boyer , LAAS-CNRS, Université de Toulouse; UPS, INSA, INP, ISAE; UT1, UTM, LAAS, France
S. Ben Dhia , LAAS-CNRS, Université de Toulouse; UPS, INSA, INP, ISAE; UT1, UTM, LAAS, France
pp. 1-5

Diagnose of radiation induced single event effects in a PLL using a heavy ion microbeam (PDF)

Santiago Sondon , GISEE, Universidad Nacional del Sur, Alem 1253, Bahía Blanca, Argentina
Alfredo Falcon , GISEE, Universidad Nacional del Sur, Alem 1253, Bahía Blanca, Argentina
Pablo Mandolesi , GISEE, Universidad Nacional del Sur, Alem 1253, Bahía Blanca, Argentina
Pedro Julian , GISEE, Universidad Nacional del Sur, Alem 1253, Bahía Blanca, Argentina
Nahuel Vega , CONICET-CNEA, General Paz 1499-1650, San Martín, Argentina
Francisco Nesprias , CONICET-CNEA, General Paz 1499-1650, San Martín, Argentina
Jorge Davidson , CONICET-CNEA, General Paz 1499-1650, San Martín, Argentina
Felix Palumbo , CONICET-CNEA, General Paz 1499-1650, San Martín, Argentina
Mario Debray , CONICET-CNEA, General Paz 1499-1650, San Martín, Argentina
pp. 1-5

Neutron sensitivity of integer and floating point operations executed in GPUs (PDF)

P. Rech , UFRGS, Universidade Federal do Rio Grande do Sul, Porto Alegre, Brazil
C. Aguiar , UFRGS, Universidade Federal do Rio Grande do Sul, Porto Alegre, Brazil
C. Frost , ISIS, Rutherford Appleton Laboratories, Didcot, UK
L. Carro , UFRGS, Universidade Federal do Rio Grande do Sul, Porto Alegre, Brazil
pp. 1-6

SPICE level analysis of Single Event Effects in an OxRRAM cell (PDF)

K. Castellani-Coulie , IM2NP-UMR CNRS 6242 / Aix-Marseille University, IM2NP, IMT Technopôle de Château - Gombert, 13451 Cedex 20, France
M. Bocquet , IM2NP-UMR CNRS 6242 / Aix-Marseille University, IM2NP, IMT Technopôle de Château - Gombert, 13451 Cedex 20, France
H. Aziza , IM2NP-UMR CNRS 6242 / Aix-Marseille University, IM2NP, IMT Technopôle de Château - Gombert, 13451 Cedex 20, France
J.M. Portal , IM2NP-UMR CNRS 6242 / Aix-Marseille University, IM2NP, IMT Technopôle de Château - Gombert, 13451 Cedex 20, France
W. Rahajandraibe , IM2NP-UMR CNRS 6242 / Aix-Marseille University, IM2NP, IMT Technopôle de Château - Gombert, 13451 Cedex 20, France
C. Muller , IM2NP-UMR CNRS 6242 / Aix-Marseille University, IM2NP, IMT Technopôle de Château - Gombert, 13451 Cedex 20, France
pp. 1-5

A test time theorem and its applications (PDF)

Praveen Venkataramani , Department of Electrical and Computer Engineering, Auburn University, AL 36849, USA
Suraj Sindia , Department of Electrical and Computer Engineering, Auburn University, AL 36849, USA
Vishwani D. Agrawal , Department of Electrical and Computer Engineering, Auburn University, AL 36849, USA
pp. 1-5

Built-in tuning of the local oscillator for open loop modulation of low cost, low power RF transceiver (PDF)

W. Rahajandraibe , IM2NP-UMR CNRS 7334 / Aix-Marseille University, 38 rue Joliot-Curie, 13013, France
F. Haddad , IM2NP-UMR CNRS 7334 / Aix-Marseille University, 38 rue Joliot-Curie, 13013, France
H. Aziza , IM2NP-UMR CNRS 7334 / Aix-Marseille University, 38 rue Joliot-Curie, 13013, France
K. Castellani-Coulie , IM2NP-UMR CNRS 7334 / Aix-Marseille University, 38 rue Joliot-Curie, 13013, France
J-M. Portal , IM2NP-UMR CNRS 7334 / Aix-Marseille University, 38 rue Joliot-Curie, 13013, France
pp. 1-4

A RTN variation tolerant guard band design for a deeper nanometer scaled SRAM screening test: Based on EM Gaussians mixtures approximations model of long-tail distributions (PDF)

Worawit Somha , Fukuoka Institute of Technology, Information Intelligent System, 3-30-1, Wajiro-Higashi, Higashi-ku, Japan
Hiroyuki Yamauchi , Fukuoka Institute of Technology, Information Intelligent System, 3-30-1, Wajiro-Higashi, Higashi-ku, Japan
pp. 1-6

Technique based on On-Chip Current Sensors and Neighbourhood Comparison Logic to detect resistive-open defects in SRAMs (PDF)

F. Lavratti , Electrical Engineering Faculty, Catholic University - PUCRS, Porto Alegre, Brazil
L. Bolzani , Electrical Engineering Faculty, Catholic University - PUCRS, Porto Alegre, Brazil
A. Calimera , Politecnico di Torino, Turin, Italy
F. Vargas , Electrical Engineering Faculty, Catholic University - PUCRS, Porto Alegre, Brazil
E. Macii , Politecnico di Torino, Turin, Italy
pp. 1-6

[Front cover] (PDF)

pp. c1

Author index (PDF)

pp. 1-12

Committees (PDF)

pp. 1-4

[Front cover] (PDF)

pp. c1
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