The Community for Technology Leaders
2013 14th Latin American Test Workshop - LATW (2011)
Porto de Galinhas
Mar. 27, 2011 to Mar. 30, 2011
ISBN: 978-1-4577-1489-4
TABLE OF CONTENTS
Papers

Sessions (PDF)

pp. 1-6

Committees (PDF)

pp. 1-2

Reviewers (PDF)

pp. 1

Sponsors (PDF)

pp. 1

Analysis of SEU parameters for the study of SRAM cells reliability under radiation (Abstract)

K. Castellani-Coulie , IM2NP, Univ. Aix-Marseille, Marseille, France
G. Micolau , IM2NP, Univ. Aix-Marseille, Marseille, France
H. Aziza , IM2NP, Univ. Aix-Marseille, Marseille, France
J.-M Portal , IM2NP, Univ. Aix-Marseille, Marseille, France
pp. 1-5

Configurable Thru-Silicon-Via interconnect Built-In Self-Test and diagnosis (Abstract)

M. Benabdenbi , TIMA Lab., Grenoble, France
Vladimir Pasca , TIMA Lab., Grenoble, France
L. Anghel , TIMA Lab., Grenoble, France
pp. 1-6

Testing in an agile product development environment: An industry experience report (Abstract)

Emanuel Silva , Nokia Inst. of Technol. (INdT), Manaus, Brazil
Borje F. Karlsson , Nokia Inst. of Technol. (INdT), Manaus, Brazil
Andre M. Cavalcante , Nokia Inst. of Technol. (INdT), Manaus, Brazil
Igor B. Correia , Nokia Inst. of Technol. (INdT), Manaus, Brazil
Andreia M. dos Santos , Fed. Univ. of Amazonas (UFAM), Manaus, Brazil
pp. 1-6

Functional test generation for the pLRU replacement mechanism of embedded cache memories (Abstract)

A. Tonda , Politec. di Torino, Torino, Italy
W. J. H. Perez , Univ. del Valle, Cali, Colombia
E. Sanchez , Politec. di Torino, Torino, Italy
J. V. Medina , Univ. del Valle, Cali, Colombia
M. S. Reorda , Politec. di Torino, Torino, Italy
pp. 1-6

Communication fault injection for multi-protocol Java applications testing (Abstract)

Taisy Silva Weber , Inst. de Inf., UFRGS, Porto Alegre, Brazil
Cristina Ciprandi Menegotto , Inst. de Inf., UFRGS, Porto Alegre, Brazil
pp. 1-6

Formally verifying an RTOS scheduling monitor IP core in embedded systems (Abstract)

C. I. Castro , Electr. Eng. Dept., Univ. of Sao Paulo, Sao Paulo, Brazil
Wang Jiang Chau , Electr. Eng. Dept., Univ. of Sao Paulo, Sao Paulo, Brazil
F. Vargas , Dept. of Electron. Syst., Catholic Univ. - PUCRS, Porto Alegre, Brazil
M. Strum , Electr. Eng. Dept., Univ. of Sao Paulo, Sao Paulo, Brazil
pp. 1-6

Reliability enhancement via Sleep Transistors (Abstract)

D. Timmermann , Inst. of Appl. Microelectron. & Comput. Eng., Univ. of Rostock, Rostock, Germany
Frank Sill Torres , Dept. of Electron. Eng., Fed. Univ. of Minas Gerais, Belo Horizonte, Brazil
C. Cornelius , Inst. of Appl. Microelectron. & Comput. Eng., Univ. of Rostock, Rostock, Germany
pp. 1-6

An improved OBT strategy for untuned continuous-time analog filters (Abstract)

C. Dualibe , Electron. & Microelectron. Dept. (SEMi), Univ. de Mons (UMons), Mons, Belgium
P. Petrashin , Microelectron. Lab., Univ. Catolica de Cordoba (UCC), Cordoba, Argentina
pp. 1-5

A TLM-based approach to functional verification of hardware components at different abstraction levels (Abstract)

A. Kamkin , Inst. for Syst. Programming, RAS, Moscow, Russia
M. Chupilko , Inst. for Syst. Programming, RAS, Moscow, Russia
pp. 1-6

A fault-tolerant service discovery protocol for emergency search and rescue missions (Abstract)

J. Kniess , Santa Catarina State Univ. (UDESC), Brazil
O. Loques , Fluminense Fed. Univ. (UFF), Niteroi, Brazil
C. V. N. Albuquerque , Fluminense Fed. Univ. (UFF), Niteroi, Brazil
pp. 1-6

Neutron detection in atmospheric environment through static and dynamic SRAM-based test bench (Abstract)

L. Dilillo , Lab. d'Inf., de Robot. et de Microelectron. de Montpellier - LIRMM, Univ. de Montpellier II, Montpellier, France
P. Rech , Lab. d'Inf., de Robot. et de Microelectron. de Montpellier - LIRMM, Univ. de Montpellier II, Montpellier, France
F. Saigne , Inst. d'Electron. du Sud, Univ. de Montpellier II, Montpellier, France
P. Girard , Lab. d'Inf., de Robot. et de Microelectron. de Montpellier - LIRMM, Univ. de Montpellier II, Montpellier, France
F. Wrobel , Inst. d'Electron. du Sud, Univ. de Montpellier II, Montpellier, France
J.-M Galliere , Lab. d'Inf., de Robot. et de Microelectron. de Montpellier - LIRMM, Univ. de Montpellier II, Montpellier, France
pp. 1-6

Methodology and platform for fault co-emulation (Abstract)

J. A. C. Sarmiento , Brazil Semicond. Technol. Center, Freescale Semicond., Campinas, Brazil
F. J. R. Fernandez , Integrated Sensor & Microsyst. Group-SIM, Univ. de Sao Paulo, Sao Paulo, Brazil
pp. 1-6

Impact of RF-based fault injection in Pierce-type crystal oscillators under EMC standard tests in microcontrollers (Abstract)

E. R. da Silva , Hardware Syst. Conception Div., Center for Technol. Inf., Campinas, Brazil
R. Maltione , Hardware Syst. Conception Div., Center for Technol. Inf., Campinas, Brazil
J. C. Silva , Hardware Syst. Conception Div., Center for Technol. Inf., Campinas, Brazil
A. Olmos , Microcontrollers Div., Freescale Semicond., Austin, TX, USA
A. V. Boas , Microcontrollers Div., Freescale Semicond., Austin, TX, USA
pp. 1-8

Test and calibration of MEMS convective accelerometers with a fully electrical setup (Abstract)

A. A. Rekik , LIRMM, Univ. Montpellier 2, Montpellier, France
F. Azais , LIRMM, Univ. Montpellier 2, Montpellier, France
P. Nouet , LIRMM, Univ. Montpellier 2, Montpellier, France
N. Dumas , LIRMM, Univ. Montpellier 2, Montpellier, France
F. Mailly , LIRMM, Univ. Montpellier 2, Montpellier, France
pp. 1-6

Behavioral-level thermal- and aging-estimation flow (Abstract)

W. Nebel , Univ. of Oldenburg, Oldenburg, Germany
S. Rosinger , OFFIS - Inst. for Inf. Technol., Oldenburg, Germany
M. Metzdorf , OFFIS - Inst. for Inf. Technol., Oldenburg, Germany
D. Helms , OFFIS - Inst. for Inf. Technol., Oldenburg, Germany
pp. 1-6

On the functional test of MESI controllers (Abstract)

M. SonzaReorda , Dipt. di Autom. e Inf., Politec. di Torino, Torino, Italy
E. Sanchez , Dipt. di Autom. e Inf., Politec. di Torino, Torino, Italy
pp. 1-6

Error-resilient design of branch predictors for effective yield improvement (Abstract)

S. Almukhaizim , Comput. Eng. Dept., Kuwait Univ., Safat, Kuwait
O. Sinanoglu , Comput. Eng. Dept., New York Univ., Abu Dhabi, United Arab Emirates
pp. 1-6

Test power reduction via deterministic alignment of stimulus and response bits (Abstract)

S. Almukhaizim , Comput. Eng. Dept., Kuwait Univ., Safat, Kuwait
E. AlQuraishi , Comput. Eng. Dept., Kuwait Univ., Safat, Kuwait
O. Sinanoglu , Comput. Eng. Dept., New York Univ., Abu Dhabi, United Arab Emirates
pp. 1-6

IC immunity modeling process validation using on-chip measurements (Abstract)

M. Deobarro , Freescale Semicond., Toulouse, France
A. Boyer , Electron. Dept., Univ. of Toulouse, Toulouse, France
B. Vrignon , Freescale Semicond., Toulouse, France
S. Ben Dhia , Electron. Dept., Univ. of Toulouse, Toulouse, France
pp. 1-6

Scan chain configuration method for broadcast decompressor architecture (Abstract)

M. Chloupek , Fac. of Inf. Technol., Czech Tech. Univ. in Prague, Prague, Czech Republic
O. Novak , Fac. of Inf. Technol., Czech Tech. Univ. in Prague, Prague, Czech Republic
pp. 1-5

Evaluating the efficiency of data-flow software-based techniques to detect SEEs in microprocessors (Abstract)

Jose Rodrigo Azambuja , Inst. de Inf., Univ. Fed. do Rio Grande do Sul UFRGS, Bento Goncalves, Brazil
Mauricio Altieri , Inst. de Inf., Univ. Fed. do Rio Grande do Sul UFRGS, Bento Goncalves, Brazil
Fernanda Lima Kastensmidt , Inst. de Inf., Univ. Fed. do Rio Grande do Sul UFRGS, Bento Goncalves, Brazil
Angelo Lapolli , Inst. de Inf., Univ. Fed. do Rio Grande do Sul UFRGS, Bento Goncalves, Brazil
pp. 1-6

Testing linear and non-linear analog circuits using moment generating functions (Abstract)

V. Singh , Supercomput. Educ. & Res. Centre, Indian Inst. of Sci., Bangalore, India
V. D. Agrawal , Dept. of Electr. & Comput. Eng., Auburn Univ., Auburn, AL, USA
S. Sindia , Dept. of Electr. & Comput. Eng., Auburn Univ., Auburn, AL, USA
pp. 1-6

Robustness with respect to SEUs of a self-converging algorithm (Abstract)

D. Sohier , Univ. de Versailles-St-Quentin-en-Yvelines, Versailles, France
W. Mansour , Lab. TIMA-UJF, Inst. Nat. Polytechmque, Grenoble, France
A. Bui , Univ. de Versailles-St-Quentin-en-Yvelines, Versailles, France
G. Marques-Costa , Lab. TIMA-UJF, Inst. Nat. Polytechmque, Grenoble, France
R. Velazco , Lab. TIMA-UJF, Inst. Nat. Polytechmque, Grenoble, France
F. Pancher , Lab. TIMA-UJF, Inst. Nat. Polytechmque, Grenoble, France
G. Foucard , Lab. TIMA-UJF, Inst. Nat. Polytechmque, Grenoble, France
pp. 1-5

Modular and adaptative test-bed for infrared photodetectors (Abstract)

L. F. M. Nohra , Inst. Tecnol. de Aeronaut., Sao Jose dos Campos, Brazil
L. A. Faria , Inst. Tecnol. de Aeronaut., Sao Jose dos Campos, Brazil
F. D. P. Alves , Naval Postgrad. Sch., Monterey, CA, USA
N. A. S. Gomes , Univ. Estadual de Campinas, Campinas, Brazil
pp. 1-6

Using an FPGA-based fault injection technique to evaluate software robustness under SEEs: A case study (Abstract)

F. Vargas , Electr. Eng. Dept., Catholic Univ. (PUCRS), Porto Alegre, Brazil
C. Lopez-Ongil , Electron. Technol. Dept., Carlos III Univ. of Madrid, Leganes, Spain
M. Garcia-Valderas , Electron. Technol. Dept., Carlos III Univ. of Madrid, Leganes, Spain
L. Entrena , Electron. Technol. Dept., Carlos III Univ. of Madrid, Leganes, Spain
M. Portela-Garcia , Electron. Technol. Dept., Carlos III Univ. of Madrid, Leganes, Spain
B. Pianta , Electr. Eng. Dept., Catholic Univ. (PUCRS), Porto Alegre, Brazil
A. Lindoso , Electron. Technol. Dept., Carlos III Univ. of Madrid, Leganes, Spain
L. B. Poehls , Electr. Eng. Dept., Catholic Univ. (PUCRS), Porto Alegre, Brazil
pp. 1-6

An approach for clustering test data (Abstract)

Silvia Regina Vergilio , Comput. Sci. Dept., Fed. Univ. of Parana - UFPR, Curitiba, Brazil
Aurora Pozo , Comput. Sci. Dept., Fed. Univ. of Parana - UFPR, Curitiba, Brazil
Alexandre Rafael Lenz , Comput. Sci. Dept., Fed. Univ. of Parana - UFPR, Curitiba, Brazil
pp. 1-6

On-line BIST for performance failure prediction under aging effects in automotive safety-critical applications (Abstract)

I. C. Teixeira , INESC-ID, Lisbon, Portugal
M. B. Santos , INESC-ID, Lisbon, Portugal
J. P. Teixeira , INESC-ID, Lisbon, Portugal
J. Semiao , INESC-ID, Lisbon, Portugal
R. S. Oliveira , INESC-ID, Lisbon, Portugal
pp. 1-6

Studying the influence of chip temperatures on timing integrity (Abstract)

A. Timar , Dept. of Electron Devices, Budapest Univ. of Technol. & Econ., Budapest, Hungary
M. Rencz , Dept. of Electron Devices, Budapest Univ. of Technol. & Econ., Budapest, Hungary
pp. 1-5

3D Thermal-aware floorplanner for many-core single-chip systems (Abstract)

D. Atienza , EPFL, Lausanne, Switzerland
D. Cuesta , Complutense Univ., Madrid, Spain
J. L. Ayala , Complutense Univ., Madrid, Spain
J. L. Risco-Martin , Complutense Univ., Madrid, Spain
pp. 1-6

Adaptive approach to tolerate multiple faulty links in Network-on-Chip (Abstract)

Caroline Concatto , PGMICRO, UFRGS - Univ. Fed. do Rio Grande do Sul, Porto Alegre, Brazil
Anelise Kologeski , PGMICRO, UFRGS - Univ. Fed. do Rio Grande do Sul, Porto Alegre, Brazil
Fernanda Lima Kastensmidt , PGMICRO, UFRGS - Univ. Fed. do Rio Grande do Sul, Porto Alegre, Brazil
Luigi Carro , PGMICRO, UFRGS - Univ. Fed. do Rio Grande do Sul, Porto Alegre, Brazil
pp. 1-6

Hybrid verificatio of temporal properties in hardware dependent software (Abstract)

W. Rosenstiel , Dept. of Comput. Eng., Univ. of Tubingen, Tubingen, Germany
D. Lettnin , Dept. of Comput. Eng., Univ. of Tubingen, Tubingen, Germany
pp. 1-6

Evaluating test reuse of a software product line oriented strategy (Abstract)

Daniela de Freitas Guilhermino Trindade , Comput. Sci. Dept., Fed. Univ. of Parana (UFPR), Curitiba, Brazil
S. R. Vergilio , Comput. Sci. Dept., Fed. Univ. of Parana (UFPR), Curitiba, Brazil
T. E. Colanzi , Comput. Sci. Dept., Fed. Univ. of Parana (UFPR), Curitiba, Brazil
W. K. G. Assuncao , Comput. Sci. Dept., Fed. Univ. of Parana (UFPR), Curitiba, Brazil
pp. 1-6
Papers

Mutation analysis for SystemC designs at TLM (Abstract)

V. Guarnieri , Dept. of Comput. Sci., Univ. of Verona, Verona, Italy
H. Hantson , Dept. of Comput. Eng., Tallinn Univ. of Technol., Tallinn, Estonia
J. Raik , Dept. of Comput. Eng., Tallinn Univ. of Technol., Tallinn, Estonia
F. Fummi , Dept. of Comput. Sci., Univ. of Verona, Verona, Italy
N. Bombieri , Dept. of Comput. Sci., Univ. of Verona, Verona, Italy
G. Pravadelli , Dept. of Comput. Sci., Univ. of Verona, Verona, Italy
M. Jenihhin , Dept. of Comput. Eng., Tallinn Univ. of Technol., Tallinn, Estonia
R. Ubar , Dept. of Comput. Eng., Tallinn Univ. of Technol., Tallinn, Estonia
pp. 1-6

Programmable sensor for on-line checking of signal integrity in FPGA-based systems subject to aging effects (Abstract)

J. Semiao , Univ. of Algarve, Faro, Portugal
I. C. Teixeira , INESC-ID, TUL, Lisbon, Portugal
J. Freijedo , Univ. of Vigo, Vigo, Spain
J. J. Rodriguez-Andina , Univ. of Vigo, Vigo, Spain
J. P. Teixeira , INESC-ID, TUL, Lisbon, Portugal
M. Valdes , Univ. of Vigo, Vigo, Spain
M. J. Moure , Univ. of Vigo, Vigo, Spain
pp. 1-7

Modeling the effect of process variations on the timing response of nanometer digital circuits (Abstract)

J. P. Teixeira , INESC-ID, IST/TUL, Portugal
I. C. Teixeira , INESC-ID, IST/TUL, Portugal
J. Semiao , Univ. of Algarve, Faro, Portugal
J. Freijedo , Univ. of Vigo, Vigo, Spain
F. Vargas , PUCRS, Porto Alegre, Brazil
J. J. Rodriguez-Andina , Univ. of Vigo, Vigo, Spain
pp. 1-5

Automated testing of embedded automotive systems from requirement specification models (Abstract)

Kai-Steffen Hielscher , Dept. of Comput. Sci., Univ. Erlangen-Nuremberg, Erlangen, Germany
Christian Berger , Automotive Safety Technol. GmbH, Ingolstadt, Germany
Reinhard German , Dept. of Comput. Sci., Univ. Erlangen-Nuremberg, Erlangen, Germany
Sebastian Siegl , Dept. of Comput. Sci., Univ. Erlangen-Nuremberg, Erlangen, Germany
pp. 1-6

Designing and analyzing a SpaceWire router IP for soft errors detection (Abstract)

F. L. Kastensmidt , Inst. de Inf., Univ. Fed. do Rio Grande do Sul (UFRGS), Rio Grande, Brazil
J. Tarrillo , Inst. de Inf., Univ. Fed. do Rio Grande do Sul (UFRGS), Rio Grande, Brazil
R. Chipana , Inst. de Inf., Univ. Fed. do Rio Grande do Sul (UFRGS), Rio Grande, Brazil
E. Chielle , Inst. de Inf., Univ. Fed. do Rio Grande do Sul (UFRGS), Rio Grande, Brazil
pp. 1-6

Functional verification of logic modules for a Gigabit Ethernet switch (Abstract)

R. Reis , Inst. de Inf., Univ. Fed. do Rio Grande do Sul (UFRGS), Porto Alegre, Brazil
G. Neuberger , Inst. de Inf., Univ. Fed. do Rio Grande do Sul (UFRGS), Porto Alegre, Brazil
J. Tonfat , Inst. de Inf., Univ. Fed. do Rio Grande do Sul (UFRGS), Porto Alegre, Brazil
pp. 1-4

A cache based algorithm to predict HDL modules faults (Abstract)

J. A. M. Nacif , Univ. Fed. de Minas Gerais, Belo Horizonte, Brazil
T. S. F. Silva , Univ. Fed. de Minas Gerais, Belo Horizonte, Brazil
C. N. Coelho , Univ. Fed. de Minas Gerais, Belo Horizonte, Brazil
L. F. M. Vieira , Univ. Fed. de Minas Gerais, Belo Horizonte, Brazil
A. B. Vieira , Univ. Fed. de Juiz de Fora, Juiz de Fora, Brazil
A. O. Fernandes , Univ. Fed. de Minas Gerais, Belo Horizonte, Brazil
pp. 1-3

NBTI-aware data allocation strategies for scratchpad memory based embedded systems (Abstract)

Cesare Ferri , Sch. of Eng., Brown Univ. Providence, Providence, RI, USA
Andrea Calimera , Dipt. di Autom. e Inf., Politec. di Torino, Turin, Italy
R. Iris Bahar , Sch. of Eng., Brown Univ. Providence, Providence, RI, USA
Dimitra Papagiannopoulou , Sch. of Eng., Brown Univ. Providence, Providence, RI, USA
pp. 1-6

Timing issues for an efficient use of concurrent error detection codes (Abstract)

M. L. Flottes , LIRMM, Univ. Montpellier II, Montpellier, France
G. Di Natale , LIRMM, Univ. Montpellier II, Montpellier, France
B. Rouzeyre , LIRMM, Univ. Montpellier II, Montpellier, France
R. P. Bastos , LIRMM, Univ. Montpellier II, Montpellier, France
pp. 1-6

A new Built-In Current Sensor scheme to detect dynamic faults in Nano-Scale SRAMs (Abstract)

F. Lavratti , Electr. Eng. Fac., Catholic Univ. (PUCRS), Porto Alegre, Brazil
E. Macii , Politec. di Torino, Turin, Italy
A. Calimera , Politec. di Torino, Turin, Italy
F. Vargas , Electr. Eng. Fac., Catholic Univ. (PUCRS), Porto Alegre, Brazil
L. Bolzani , Electr. Eng. Fac., Catholic Univ. (PUCRS), Porto Alegre, Brazil
pp. 1-6

Configurable platform for IC combined tests of total-ionizing dose radiation and electromagnetic immunity (Abstract)

F. Vargas , Electr. Eng. Dept., Catholic Univ. - PUCRS, Porto Alegre, Brazil
S. E. Garcia , Fac. de Ing., Univ. de Buenos Aires, Buenos Aires, Argentina
J. Lipovetzky , Fac. de Ing., Univ. de Buenos Aires, Buenos Aires, Argentina
E. Gatti , Inst. Nac. de Tecnol. Ind. - INTI, Buenos Aires, Argentina
J. Benfica , Electr. Eng. Dept., Catholic Univ. - PUCRS, Porto Alegre, Brazil
N. L. V. Calazans , Fac. of Inf., Catholic Univ. - PUCRS, Porto Alegre, Brazil
F. Hernandez , Univ. ORT, Montevideo, Uruguay
L. B. Poehls , Electr. Eng. Dept., Catholic Univ. - PUCRS, Porto Alegre, Brazil
A. Lutenberg , Fac. de Ing., Univ. de Buenos Aires, Buenos Aires, Argentina
pp. 1-6

Impact of SEU configurations on a SRAM cell response at circuit level (Abstract)

G. Micolau , IMT Technopole de Chateau, Univ. Aix-Marseille, Marseille, France
J. Portal , IMT Technopole de Chateau, Univ. Aix-Marseille, Marseille, France
K. Castellani-Coulie , IMT Technopole de Chateau, Univ. Aix-Marseille, Marseille, France
H. Aziza , IMT Technopole de Chateau, Univ. Aix-Marseille, Marseille, France
pp. 1-5

Prediction of long-term immunity of a phase-locked loop (Abstract)

S. Ben Dhia , Electron. Dept., Univ. of Toulouse, Toulouse, France
C. Lemoine , Electron. Dept., Univ. of Toulouse, Toulouse, France
A. Boyer , Electron. Dept., Univ. of Toulouse, Toulouse, France
B. Vrignon , Freescale Semicond., Toulouse, France
B. Li , Electron. Dept., Univ. of Toulouse, Toulouse, France
pp. 1-6

Evaluating coverage collection using the VEasy functional verification tool suite (Abstract)

Fernanda Lima Kastensmidt , Programa de Pos-Grad. em Microeletronica, Univ. Fed. do Rio Grande do Sul (UFRGS), Porto Alegre, Brazil
Samuel Nascimento Pagliarini , Programa de Pos-Grad. em Microeletronica, Univ. Fed. do Rio Grande do Sul (UFRGS), Porto Alegre, Brazil
Paulo Andre Haacke , Programa de Pos-Grad. em Microeletronica, Univ. Fed. do Rio Grande do Sul (UFRGS), Porto Alegre, Brazil
pp. 1-6

First studies of the impact of dose radiation on the electromagnetic susceptibility of bipolar transistors (Abstract)

L. Dusseau , Inst. d'Electron. du Sud (IES), Montpellier, France
A. Blain , Inst. d'Electron. du Sud (IES), Montpellier, France
P. Hoffinann , DAM, CEA, Gramat, France
P. Calvel , Thales Alenia Space, Toulouse, France
J. Raoult , Inst. d'Electron. du Sud (IES), Montpellier, France
T. Dubois , Poly-Grames, Montreal, QC, Canada
S. Jarrix , Inst. d'Electron. du Sud (IES), Montpellier, France
A. Doridant , Inst. d'Electron. du Sud (IES), Montpellier, France
N. Chatry , TRAD, Labege, France
pp. 1-4

Investigating the effects of transient faults in Programmable Capacitor Arrays (Abstract)

G. S. Cardoso , Univ. Fed. do Rio Grande do Sul, Porto Alegre, Brazil
M. S. Lubaszewski , Univ. Fed. do Rio Grande do Sul, Porto Alegre, Brazil
O. L. Goncalez , Inst. de Estudos Avancados (IEAv), Sao Jose dos Campos, Brazil
T. R. Balen , Univ. Fed. do Rio Grande do Sul, Porto Alegre, Brazil
pp. 1-6

Testing for faults, looking for defects (Abstract)

Vishwani D. Agrawal , Auburn Univ., Auburn, AL, USA
pp. 1
96 ms
(Ver 3.1 (10032016))