The Community for Technology Leaders
2010 11th Latin American Test Workshop (2010)
Pule del Este Uruguay
Mar. 28, 2010 to Mar. 31, 2010
ISBN: 978-1-4244-7786-9
TABLE OF CONTENTS

Manufacturers to end-users tools for radiations induced reliability issues in electronic devices (PDF)

Frederic Wrobel , University of Montpellier II, Place Eugène Bataillon, CC 083, 34095 Montpellier, France
pp. 1

Heterogeneous integration: Beyond CMOS – coping with variability at the end of the CMOS roadmap (PDF)

Sergio Bampi , Microelectronics Group - Federal University of Rio Grande do Sul - UFRGS, Porto Alegre - Brazil
pp. 1

Reliability and safety of medical equipment by use of calibration and certification instruments (PDF)

Guillermo Avendano , Departamento de Ingeniería Biomédica Universidad de Valparaíso, Chile
Pablo Fuentes , Departamento de Ingeniería Biomédica Universidad de Valparaíso, Chile
Victor Castillo , Departamento de Ingeniería Biomédica Universidad de Valparaíso, Chile
Constanza Garcia , Departamento de Ingeniería Biomédica Universidad de Valparaíso, Chile
Natalie Dominguez , Departamento de Ingeniería Biomédica Universidad de Valparaíso, Chile
pp. 1-4

On improving real-time observability for in-system post-silicon debug (PDF)

Nicola Nicolici , Department of Electrical and Computer Engineering, McMaster University, Hamilton, ON L8S 4K1, Canada
pp. 1

Variability-aware physical design techniques (PDF)

Gustavo Wilke , Instituto de Informática - PGMICRO/PPGC - UFRGS, Porto Alegre, Brazil
Ricardo Reis , Instituto de Informática - PGMICRO/PPGC - UFRGS, Porto Alegre, Brazil
pp. 1

An algorithm for diagnostic fault simulation (PDF)

Yu Zhang , Auburn University, Department of Electrical and Computer Engineering, Auburn, AL 36849, USA
Vishwani D. Agrawal , Auburn University, Department of Electrical and Computer Engineering, Auburn, AL 36849, USA
pp. 1-5

The limitations of software signature and basic block sizing in soft error fault coverage (PDF)

Jose Rodrigo Azambuja , Instituto de Informática Universidade Federal do Rio Grande do Sul (UFRGS) Av. Bento Gonçalves 9500, Porto Alegre - RS - Brazil
Fernando Sousa , Instituto de Informática Universidade Federal do Rio Grande do Sul (UFRGS) Av. Bento Gonçalves 9500, Porto Alegre - RS - Brazil
Lucas Rosa , Instituto de Informática Universidade Federal do Rio Grande do Sul (UFRGS) Av. Bento Gonçalves 9500, Porto Alegre - RS - Brazil
Fernanda Lima Kastensmidt , Instituto de Informática Universidade Federal do Rio Grande do Sul (UFRGS) Av. Bento Gonçalves 9500, Porto Alegre - RS - Brazil
pp. 1-8

Diversity TMR: Proof of concept in a mixed-signal case (PDF)

Gabriel de M. Borges , Universidade Federal do Rio Grande do Sul, Departamento de Engenharia Elétrica, Porto Alegre, RS, Brazil
Luiz F. Goncalves , Universidade Federal do Rio Grande do Sul, Departamento de Engenharia Elétrica, Porto Alegre, RS, Brazil
Tiago R. Balen , Universidade Federal do Rio Grande do Sul, Departamento de Engenharia Elétrica, Porto Alegre, RS, Brazil
Marcelo Lubaszewski , Universidade Federal do Rio Grande do Sul, Departamento de Engenharia Elétrica, Porto Alegre, RS, Brazil
pp. 1-6

Automatic generation of a parameter-domain-based functional input coverage model (PDF)

Carlos Ivan Castro , Department of Electronic Systems School of Engineering - University of Sao Paulo
Marius Strum , Department of Electronic Systems School of Engineering - University of Sao Paulo
Wang Jiang Chau , Department of Electronic Systems School of Engineering - University of Sao Paulo
pp. 1-6

A method for improving the radiation tolerance of PIN photodiodes by optimization of n layer thickness and light wavelength (PDF)

A. P. Cedola , GEMYDE, Faculty of Engineering, National University of La Plata, Buenos Aires, Argentina
M. A. Cappelletti , GEMYDE, Faculty of Engineering, National University of La Plata, Buenos Aires, Argentina
E. L. Peltzer y Blanca , GEMYDE, Faculty of Engineering, National University of La Plata, Buenos Aires, Argentina
pp. 1-4

BICS-based March test for resistive-open defect detection in SRAMs (PDF)

R. Chipana , Electrical Engineering Dept., Catholic University - PUCRS, Porto Alegre, Brazil
L. Bolzani , Electrical Engineering Dept., Catholic University - PUCRS, Porto Alegre, Brazil
F. Vargas , Electrical Engineering Dept., Catholic University - PUCRS, Porto Alegre, Brazil
pp. 1-6

On Comparing and Complementing two MBT approaches (PDF)

Maximiliano Cristia , Flowgate and CIFASIS, Rosario, Argentina
Valdivino Santiago , INPE, São José dos Campos, Brazil
N. L. Vijaykumar , INPE, São José dos Campos, Brazil
pp. 1-6

Bit-flip injection strategies for FSMs modeled in VHDL behavioral level (PDF)

John M. Espinosa-Duran , School of Electrical and Electronics Engineering, Universidad del Valle, Cali, Colombia
Vladimir Trujillo-Olaya , School of Electrical and Electronics Engineering, Universidad del Valle, Cali, Colombia
Jaime Velasco-Medina , School of Electrical and Electronics Engineering, Universidad del Valle, Cali, Colombia
Raoul Velazco , TIMA Laboratory, INPG, Grenoble, France
pp. 1-5

Reliability limits of TMR implemented in a SRAM-based FPGA: Heavy ion measures vs. fault injection predictions (PDF)

G. Foucard , Laboratoire TIMA, Grenoble, France
P. Peronnard , Laboratoire TIMA, Grenoble, France
R. Velazco , Laboratoire TIMA, Grenoble, France
pp. 1-5

Fault prediction in electrical valves using temporal Kohonen maps (PDF)

Luiz F. Goncalves , Universidade Federal do Rio Grande do Sul, Departamento de Engenharia Elétrica, Porto Alegre, RS, Brasil
Eduardo L. Schneider , Universidade Federal do Rio Grande do Sul, Departamento de Engenharia Elétrica, Porto Alegre, RS, Brasil
Renato Ventura B. Henriques , Universidade Federal do Rio Grande do Sul, Departamento de Engenharia Elétrica, Porto Alegre, RS, Brasil
Marcelo Lubaszewski , Universidade Federal do Rio Grande do Sul, Departamento de Engenharia Elétrica, Porto Alegre, RS, Brasil
Jefferson Luiz Bosa , Universidade Federal do Rio Grande do Sul, Instituto de Informática, Porto Alegre, RS, Brasil
Paulo Martins Engel , Universidade Federal do Rio Grande do Sul, Instituto de Informática, Porto Alegre, RS, Brasil
pp. 1-6

Functional test generation for DMA controllers (Abstract)

M. Grosso , Politecnico di Torino, Torino, Italy
W. J. Perez H. , Universidad del Valle, Cali, Colombia
D. Ravotto , Politecnico di Torino, Torino, Italy
E. Sanchez , Politecnico di Torino, Torino, Italy
M. Sonza Reorda , Politecnico di Torino, Torino, Italy
J. Velasco Medina , Universidad del Valle, Cali, Colombia
pp. 1-6

Procedures and lab setup developed to test MIFARE based transportation devices compliance (PDF)

Fiorella Haim , Electronics department. Laboratorio Tecnológico del Uruguay (LATU)
Andres Bergeret , Electronics department. Laboratorio Tecnológico del Uruguay (LATU)
Alejandra Gonzalez , Electronics department. Laboratorio Tecnológico del Uruguay (LATU)
Ignacio Benavente , Electronics department. Laboratorio Tecnológico del Uruguay (LATU)
pp. 1-5

Mutation analysis with high-level decision diagrams (PDF)

Hanno Hantson , Department of Computer Engineering, Tallinn University of Technology, Tallinn, Estonia
Jaan Raik , Department of Computer Engineering, Tallinn University of Technology, Tallinn, Estonia
Maksim Jenihhin , Department of Computer Engineering, Tallinn University of Technology, Tallinn, Estonia
Anton Chepurov , Department of Computer Engineering, Tallinn University of Technology, Tallinn, Estonia
Raimund Ubar , Department of Computer Engineering, Tallinn University of Technology, Tallinn, Estonia
Giuseppe di Guglielmo , Department of Computer Science, University of Verona, Verona, Italy
Franco Fummi , Department of Computer Science, University of Verona, Verona, Italy
pp. 1-6

Concurrent test of Network-on-Chip interconnects and routers (PDF)

Marcos Herve , Universidade Federal do Rio Grande do Sul, PPGC - PGMICRO - Instituto de Informática / Escola de Engenharia, P.O. Box 15064, ZIP 91501-970, Porto Alegre, RS, Brazil
Pedro Almeida , Universidade Federal do Rio Grande do Sul, PPGC - PGMICRO - Instituto de Informática / Escola de Engenharia, P.O. Box 15064, ZIP 91501-970, Porto Alegre, RS, Brazil
Fernanda Lima Kastensmidt , Universidade Federal do Rio Grande do Sul, PPGC - PGMICRO - Instituto de Informática / Escola de Engenharia, P.O. Box 15064, ZIP 91501-970, Porto Alegre, RS, Brazil
Erika Cota , Universidade Federal do Rio Grande do Sul, PPGC - PGMICRO - Instituto de Informática / Escola de Engenharia, P.O. Box 15064, ZIP 91501-970, Porto Alegre, RS, Brazil
Marcelo Lubaszewski , Universidade Federal do Rio Grande do Sul, PPGC - PGMICRO - Instituto de Informática / Escola de Engenharia, P.O. Box 15064, ZIP 91501-970, Porto Alegre, RS, Brazil
pp. 1-6

Towards a transmission power self-optimization in reliable Wireless Sensor Networks (PDF)

F. Lavratti , Catholic University of Rio Grande do Sul, PUCRS, Porto Alegre, Brazil
A. R. Pinto , PGEEL, Universidade Federal de Santa Catarina, UFSC Florianópolis, Brazil
D. Prestes , Catholic University of Rio Grande do Sul, PUCRS, Porto Alegre, Brazil
L. Bolzani , Catholic University of Rio Grande do Sul, PUCRS, Porto Alegre, Brazil
F. Vargas , Catholic University of Rio Grande do Sul, PUCRS, Porto Alegre, Brazil
C. Montez , PGEEL, Universidade Federal de Santa Catarina, UFSC Florianópolis, Brazil
pp. 1-3

Automated test-bed for analog to digital converters (PDF)

Jose Erick de Souza Lima , Science, Technology and Innovation Center, for the Industry of Manaus, CT-PIM, Manaus, AM, Brazil
Carlos A. dos Reis Filho , School of Electrical and Computer Engineering, State, University of Campinas, Unicamp, Campinas, SP, Brazil
pp. 1-5

RF and Microwave production test requirements for advanced mixed-signal devices (PDF)

Mohamed Mabrouk , CIRTACOM- SUPCOM-ISETCOM de Tunis, Cité Technologique des Communications, 2088, Tunisia
pp. 1-4

Test mode method and strategy for RF-based fault injection analysis for on-chip relaxation oscillators under EMC standard tests or RFI susceptibility characterization (PDF)

A. Olmos , Freescale Semiconductor, Austin, USA
A. Vilas Boas , Freescale Semiconductor, Campinas, Brazil
E. R. da Silva , Center for Technology Information, Campinas, Brazil
J. C. Silva , Center for Technology Information, Campinas, Brazil
R. Maltione , Center for Technology Information, Campinas, Brazil
pp. 1-3

Performance evaluation model for test process (PDF)

Marcelo Marinho , Federal University of Pernambuco (UFPE), Informatics Center (CIn), Recife, PE, Brazil
Paulo Maciel , Federal University of Pernambuco (UFPE), Informatics Center (CIn), Recife, PE, Brazil
Erica Sousa , Federal University of Pernambuco (UFPE), Informatics Center (CIn), Recife, PE, Brazil
Teresa Maciel , Federal University of Pernambuco (UFPE), Informatics Center (CIn), Recife, PE, Brazil
Ermeson Andrade , Federal University of Pernambuco (UFPE), Informatics Center (CIn), Recife, PE, Brazil
pp. 1-6

Performance testing of distributed block-oriented storage over IP networks (PDF)

Pedro Martinez-Julia , Department of Communication, and Information Engineering, University of Murcia, 30100, Murcia, Spain
Antonio F. Gomez-Skarmeta , Department of Communication, and Information Engineering, University of Murcia, 30100, Murcia, Spain
pp. 1-4

Emulating an Agilent™ 4142 on a Keithley™ 2600 series Source Measurement Unit (PDF)

Jorge Moreno , Electrical and Computer Engineering Department, University of Puerto Rico at Mayaguez
Osvaldo Gonzalez , Electrical and Computer Engineering Department, University of Puerto Rico at Mayaguez
Rafael Vega , Electrical and Computer Engineering Department, University of Puerto Rico at Mayaguez
Rogelio Palomera , Electrical and Computer Engineering Department, University of Puerto Rico at Mayaguez
Manuel Jimenez , Electrical and Computer Engineering Department, University of Puerto Rico at Mayaguez
pp. 1-3

Experimental dependability assessment using a faultload specification tool (PDF)

Ruthiano S. Munaretti , Institute of Informatics - Federal University of Rio Grande do Sul Caixa Postal 15064 - 90501-970 - Porto Alegre, RS, Brazil
Bruno C. Fiss , Institute of Informatics - Federal University of Rio Grande do Sul Caixa Postal 15064 - 90501-970 - Porto Alegre, RS, Brazil
Taisy S. Weber , Institute of Informatics - Federal University of Rio Grande do Sul Caixa Postal 15064 - 90501-970 - Porto Alegre, RS, Brazil
Sergio L. Cechin , Institute of Informatics - Federal University of Rio Grande do Sul Caixa Postal 15064 - 90501-970 - Porto Alegre, RS, Brazil
pp. 1-6

Dynamic power modulation in baseband OFDM signal processor using application driven metrics: Image transmission and processing (PDF)

Muhammad M. Nisar , School of Electrical and Computer Engineering Georgia Institute of Technology, Atlanta, GA
Jayaram Natarajan , School of Electrical and Computer Engineering Georgia Institute of Technology, Atlanta, GA
Abhijit Chatterjee , School of Electrical and Computer Engineering Georgia Institute of Technology, Atlanta, GA
pp. 1-6

Dependability evaluation of distributed systems through partitioning fault injection (PDF)

Gustavo M. Oliveira , Instituto de Informática - Universidade Federal do Rio Grande do Sul Caixa Postal 15064 - 90501-970 Porto Alegre, RS, Brazil
Sergio L. Cechin , Instituto de Informática - Universidade Federal do Rio Grande do Sul Caixa Postal 15064 - 90501-970 Porto Alegre, RS, Brazil
Taisy S. Weber , Instituto de Informática - Universidade Federal do Rio Grande do Sul Caixa Postal 15064 - 90501-970 Porto Alegre, RS, Brazil
pp. 1-6

Experiments on the analysis of phase/frequency-modulated RF signals using digital tester channels (PDF)

N. Pous , LIRMM & Verigy Montpellier, France
F. Azais , LIRMM, CNRS/Univ. Montpellier 2, CC 477 - 161 rue Ada 34095 Montpellier Cedex 5 - France
L. Latorre , LIRMM, CNRS/Univ. Montpellier 2, CC 477 - 161 rue Ada 34095 Montpellier Cedex 5 - France
P. Nouet , LIRMM, CNRS/Univ. Montpellier 2, CC 477 - 161 rue Ada 34095 Montpellier Cedex 5 - France
J. Rivoir , Verigy Germany GmbH, Herrenberger Str. 130, 71034 Boeblingen - Germany
pp. 1-7

Evaluation of a new low cost software level fault tolerance technique to cope with soft errors (PDF)

J. F. Tarrillo , Instituto de Informática, PPGC Universidade Federal do Rio Grande do Sul
C. A. Lisboa , Instituto de Informática, PPGC Universidade Federal do Rio Grande do Sul
L. Carro , Instituto de Informática, PPGC Universidade Federal do Rio Grande do Sul
C. Argyrides , Department of Computer Science Bristol University
D. K. Pradhan , Department of Computer Science Bristol University
pp. 1-3

An evaluation of free/open source static analysis tools applied to embedded software (PDF)

Lucas Torri , Universidade Federal do Rio Grande do Sul, PPGC - Instituto de Informática, Po Box 15064, ZIP 91501-970, Porto Alegre, RS, Brazil
Guilherme Fachini , Universidade Federal do Rio Grande do Sul, PPGC - Instituto de Informática, Po Box 15064, ZIP 91501-970, Porto Alegre, RS, Brazil
Leonardo Steinfeld , Universidade Federal do Rio Grande do Sul, PPGC - Instituto de Informática, Po Box 15064, ZIP 91501-970, Porto Alegre, RS, Brazil
Vesmar Camara , Universidade Federal do Rio Grande do Sul, PPGC - Instituto de Informática, Po Box 15064, ZIP 91501-970, Porto Alegre, RS, Brazil
Luigi Carro , Universidade Federal do Rio Grande do Sul, PPGC - Instituto de Informática, Po Box 15064, ZIP 91501-970, Porto Alegre, RS, Brazil
Erika Cota , Universidade Federal do Rio Grande do Sul, PPGC - Instituto de Informática, Po Box 15064, ZIP 91501-970, Porto Alegre, RS, Brazil
pp. 1-6

Dependability validation of a cryptoprocessor to SEU effects (PDF)

Vladimir Trujillo-Olaya , School of Electrical and Electronics Engineering, Universidad del Valle, Cali, Colombia
John M. Espinosa-Duran , School of Electrical and Electronics Engineering, Universidad del Valle, Cali, Colombia
Jaime Velasco-Medina , School of Electrical and Electronics Engineering, Universidad del Valle, Cali, Colombia
Raoul Velazco , TIMA Laboratory INPG, Grenoble, France
pp. 1-6

Reliability analysis of small delay defects in vias located in signal paths (PDF)

Hector Villacorta , Dept. of Electronic Engineering, National Institute for Astrophysics, Optics and Electronics-INAOE, Puebla, Mexico
Victor Champac , Dept. of Electronic Engineering, National Institute for Astrophysics, Optics and Electronics-INAOE, Puebla, Mexico
Chuck Hawkins , ECE Dept., University of New Mexico, Albuquerque, NM USA
Jaume Segura , University of Balearic Islands, Mallorca, Spain
pp. 1-6

Reliability of on-board computer for ITASAT university satellite (PDF)

Edson Vinci , ITA - Instituto Tecnológico de Aeronáutica. Pça. Mal. Eduardo Gomes, 50, Vila das Acácias, CEP 12.228-900, São José dos Campos, SP, Brazil
Osamu Saotome , ITA - Instituto Tecnológico de Aeronáutica. Pça. Mal. Eduardo Gomes, 50, Vila das Acácias, CEP 12.228-900, São José dos Campos, SP, Brazil
pp. 1-3
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