The Community for Technology Leaders
2011 IEEE International Test Conference (2011)
Anaheim, CA USA
Sept. 20, 2011 to Sept. 22, 2011
ISSN: 1089-3539
ISBN: 978-1-4577-0153-5
TABLE OF CONTENTS

Test cost reduction through performance prediction using virtual probe (Abstract)

Hsiu-Ming Chang , Univ. of California, Santa Barbara, CA, USA
Kwang-Ting Cheng , Univ. of California, Santa Barbara, CA, USA
Wangyang Zhang , Carnegie Mellon Univ., Pittsburgh, PA, USA
Xin Li , Carnegie Mellon Univ., Pittsburgh, PA, USA
K. M. Butler , Texas Instrum., Dallas, TX, USA
pp. 1-9

Physically-aware analysis of systematic defects in integrated circuits (Abstract)

Wing Chiu Tam , ECE Dept., Carnegie Mellon Univ., Pittsburgh, PA, USA
R. D. Blanton , ECE Dept., Carnegie Mellon Univ., Pittsburgh, PA, USA
pp. 1-10

Wafer probe test cost reduction of an RF/A device by automatic testset minimization — A case study (Abstract)

Dragoljub Drmanac , Univ. of California, Santa Barbara, CA, USA
Li C. Wang , Univ. of California, Santa Barbara, CA, USA
pp. 1-10

Design-for-debug layout adjustment for FIB probing and circuit editing (Abstract)

Kuo-An Chen , Dept. of Electronics Engineering, National Chiao Tung University, Hsinchu, Taiwan
Tsung-Wei Chang , Dept. of Electronics Engineering, National Chiao Tung University, Hsinchu, Taiwan
Meng-Chen Wu , Dept. of Electronics Engineering, National Chiao Tung University, Hsinchu, Taiwan
Mango C.-T. Chao , Dept. of Electronics Engineering, National Chiao Tung University, Hsinchu, Taiwan
Jing-Yang Jou , Dept. of Electronics Engineering, National Chiao Tung University, Hsinchu, Taiwan
Sonair Chen , Spirox Corporation, Hsinchu, Taiwan
pp. 1-9
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