The Community for Technology Leaders
CSDL Home I ITC 2009
2013 IEEE International Test Conference (ITC) (2009)
Austin, TX USA
Nov. 1, 2009 to Nov. 6, 2009
ISBN: 978-1-4244-4868-5
TABLE OF CONTENTS

[Copyright notice] (PDF)

pp. ii

TTTC: Test Technology Technical Council (PDF)

pp. 14-16

The best of both worlds: Merging the benefits of Rack&Stack and universal ATE (PDF)

pp. 1-10
90 ms
(Ver 3.3 (11022016))