2009 International Test Conference (2009)
Austin, TX USA
Nov. 1, 2009 to Nov. 6, 2009
ISBN: 978-1-4244-4868-5
TABLE OF CONTENTS
[Copyright notice] (PDF)
pp. ii
TTTC: Test Technology Technical Council (PDF)
pp. 14-16
The best of both worlds: Merging the benefits of Rack&Stack and universal ATE (PDF)
Ping Lu , Reliable Circuits and Systems, Friedrich-Alexander-University Erlangen-Nuremberg, Paul-Gordan-Str. 5, 91052, Germany
Daniel Glaser , Reliable Circuits and Systems, Friedrich-Alexander-University Erlangen-Nuremberg, Paul-Gordan-Str. 5, 91052, Germany
Gurkan Uygur , Reliable Circuits and Systems, Friedrich-Alexander-University Erlangen-Nuremberg, Paul-Gordan-Str. 5, 91052, Germany
Klaus Helmreich , Reliable Circuits and Systems, Friedrich-Alexander-University Erlangen-Nuremberg, Paul-Gordan-Str. 5, 91052, Germany
pp. 1-10
