The Community for Technology Leaders
2008 IEEE International Test Conference (2008)
Santa Clara, CA USA
Oct. 28, 2008 to Oct. 30, 2008
ISSN: 1089-3539
ISBN: 978-1-4244-2402-3
TABLE OF CONTENTS

Time-dependent Behaviour of Full Open Defects in Interconnect Lines (Abstract)

R. Rodriguez-Montanes , Universitat Politècnica de Catalunya, Departament d'Enginyeria Electrònica, Diagonal, 647, P9, 08028 Barcelona, SPAIN
D. Arumi , Universitat Politècnica de Catalunya, Departament d'Enginyeria Electrònica, Diagonal, 647, P9, 08028 Barcelona, SPAIN
J. Figueras , Universitat Politècnica de Catalunya, Departament d'Enginyeria Electrònica, Diagonal, 647, P9, 08028 Barcelona, SPAIN
S. Eichenberger , NXP Semiconductors, THE NETHERLANDS. stefan.eichenberger@nxp.com
C. Hora , NXP Semiconductors, THE NETHERLANDS. camelia.hora@nxp.com
B. Kruseman , NXP Semiconductors, THE NETHERLANDS. bram.kruseman@nxp.com
pp. 1-10

A Hybrid A/D Converter with 120dB SNR and -125dB THD (Abstract)

Mamoru Tamba , Yokogawa Electric Corporation
pp. 1-9

Overview of OpenSPARC (PDF)

Ishwar Parulkar , Sun Microsystems. ishwar.parulkar@sun.com
pp. 1
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