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2013 IEEE International Test Conference (ITC) (2004)
Charlotte, NC, USA
Oct. 26, 2004 to Oct. 28, 2004
ISSN: 1089-3539
ISBN: 0-7803-8581-0
pp: 1448-1456
Anne Meixner , Intel Corporation
Mike Tripp , Intel Corporation
T.M. Mak , Intel Corporation
This paper summarizes the Design for Test (DFT) circuitry and test methods that enabled Intel to shift away from traditional functional testing of I/O?s. This shift was one of the key enablers for Automatic Test Equipment (ATE) re-use and the move to lower capability (& cost) structural test platforms. Specific examples include circuit implementations from the Pentium? 4 processor, High Volume Manufacturing (HVM) data, and evolutionary changes to address key learnings. We close with indications of how this can be extended to cover the next generation High Speed Serial like interfaces.
Anne Meixner, Mike Tripp, T.M. Mak, "Elimination of Traditional Functional Testing of Interface Timings at Intel", 2013 IEEE International Test Conference (ITC), vol. 00, no. , pp. 1448-1456, 2004, doi:10.1109/ITC.2004.68
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