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2004 International Conferce on Test (2004)
Charlotte, NC, USA
Oct. 26, 2004 to Oct. 28, 2004
ISSN: 1089-3539
ISBN: 0-7803-8581-0
pp: 688-697
Bart Vermeulen , Philips Research Laboratories, Netherlands
Camelia Hora , Philips Research Laboratories, Netherlands
Bram Kruseman , Philips Research Laboratories, Netherlands
Erik Jan Marinissen , Philips Research Laboratories, Netherlands
Robert Van Rijsinge , Philips Semiconductors - ATO, Nijmegen, Netherlands
ABSTRACT
New process technologies, increased design complexity, and more stringent customer quality requirements drive the need for better test quality, improved test program development, and faster ramp-up at overall lower product cost. In this paper we describe the main industry test trends and recent innovations in testing integrated circuits as they are applied within Philips.
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CITATION

R. Van Rijsinge, E. Jan Marinissen, B. Vermeulen, B. Kruseman and C. Hora, "Trends in Testing Integrated Circuits," 2004 International Conferce on Test(ITC), Charlotte, NC, USA, 2004, pp. 688-697.
doi:10.1109/ITC.2004.196
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