2004 International Conferce on Test (2004)
Charlotte, NC, USA
Oct. 26, 2004 to Oct. 28, 2004
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ITC.2004.196
Bart Vermeulen , Philips Research Laboratories, Netherlands
Camelia Hora , Philips Research Laboratories, Netherlands
Bram Kruseman , Philips Research Laboratories, Netherlands
Erik Jan Marinissen , Philips Research Laboratories, Netherlands
Robert Van Rijsinge , Philips Semiconductors - ATO, Nijmegen, Netherlands
New process technologies, increased design complexity, and more stringent customer quality requirements drive the need for better test quality, improved test program development, and faster ramp-up at overall lower product cost. In this paper we describe the main industry test trends and recent innovations in testing integrated circuits as they are applied within Philips.
R. Van Rijsinge, E. Jan Marinissen, B. Vermeulen, B. Kruseman and C. Hora, "Trends in Testing Integrated Circuits," 2004 International Conferce on Test(ITC), Charlotte, NC, USA, 2004, pp. 688-697.