Proceedings. International Test Conference (2002)
Baltimore, MD, USA
Oct. 7, 2002 to Oct. 10, 2002
Bart Vermeulen , Philips Research Laboratories
Tom Waayers , Philips Research Laboratories
Sandeep Kumar Goel , Philips Research Laboratories
In this paper, we present a core-based scan architecture for silicon debug, which is currently being standardized within Philips. The reasons behind the core-based debug architecture, together with implementation details, are described. The choices that were made during its development are explained using the experiences gained from two large Philips system chips that each utilize core-based design and test, and scan-based silicon debug. The results of an area-cost evaluation of the presented architecture for these two large system chips are also presented.
B. Vermeulen, T. Waayers and S. K. Goel, "Core-Based Scan Architecture for Silicon Debug," Proceedings. International Test Conference(ITC), Baltimore, MD, USA, 2002, pp. 638.