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Proceedings. International Test Conference (2002)
Baltimore, MD, USA
Oct. 7, 2002 to Oct. 10, 2002
ISBN: 0-7803-7543-2
pp: 178
This paper describes a novel on chip repair system designed for ATE independent application on many unique very dense ASIC devices in a high turnover environment. During test, the system will control on chip built-in self-test (BIST) engines, collect and compress repair data, program fuses and finally decompress and reload the repair data for post fuse testing. In end use application this system decompresses and loads the repair data at power-up or at the request of the system.

D. L. Wheater, P. Jakobsen, M. R. Ouellette, S. Oakland, B. Cowan and O. Farnsworth, "On-Chip Repair and an ATE Independent Fusing Methodology," Proceedings. International Test Conference(ITC), Baltimore, MD, USA, 2002, pp. 178.
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