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2013 IEEE International Test Conference (ITC) (2001)
Baltimore, Maryland
Oct. 30, 2001 to Nov. 1, 2001
ISBN: 0-7803-7171-2
pp: 548
Sandeep K. Gupta , University of Southern California, Los Angeles
Liang-Chi Chen , University of Southern California, Los Angeles
T. M. Mak , Intel Corporation
Melvin A. Breuer , University of Southern California, Los Angeles
ABSTRACT
In this paper we present data that validates the viability of a university prototype crosstalk ATPG system, XGEN, on real designs. We remodeled Intel circuits and performed test generation using actual parasitic data. A crosstalk ATPG implementation flow was developed based on Intel tools. Validation results are shown for the modified circuits. Critical issues for preserving accurate timing information and capturing crosstalk effects are discussed.
INDEX TERMS
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CITATION
Sandeep K. Gupta, Liang-Chi Chen, T. M. Mak, Melvin A. Breuer, "Crosstalk Test Generation on Pseudo industrial Circuits: A Case Study", 2013 IEEE International Test Conference (ITC), vol. 00, no. , pp. 548, 2001, doi:10.1109/TEST.2001.966673
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