Proceedings International Test Conference 2001 (Cat. No.01CH37260) (2001)
Oct. 30, 2001 to Nov. 1, 2001
Bart Vermeulen , Philips Research Laboratories
Steven Oostdijk , Philips Semiconductors North America
Frank Bouwman , Philips Semiconductors North America
Decreasing feature sizes and increasing customer demand for more functionality have forced design teams to re-use design blocks and application platforms. As a result, re-use of test, design-for-test and design-for-debug for large system chips is becoming increasingly important and increasingly necessary. In this paper, the test and debug features of the Nexperia™ PNX8525 chip are presented. The PNX8525 chip is a large system chip for the consumer electronics market. The impact of core-based testing is discussed, at both the core-level and the top-level, together with the design-for-debug implementation on this multiple clock domain chip.
F. Bouwman, B. Vermeulen and S. Oostdijk, "Test and Debug Strategy of the PNX8525 Nexperia™ Digital Video Platform System Chip," Proceedings International Test Conference 2001 (Cat. No.01CH37260)(ITC), Baltimore, Maryland, 2001, pp. 121.