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Proceedings International Test Conference 2000 (IEEE Cat. No.00CH37159) (2000)
Atlantic City, NJ, USA
Oct. 3, 2000 to Oct. 5, 2000
ISSN: 1089-3539
ISBN: 0-7803-6546-1
pp: 930
Jennifer Dworak , Texas A&M University, College Station, Texas
Micheal R. Grimaila , Texas A&M University, College Station, Texas
Sooryong Lee , Texas A&M University, College Station, Texas
Li-C. Wang , Texas A&M University, College Station, Texas
M. Ray Mecer , Texas A&M University, College Station, Texas
ABSTRACT
Predicting the final value of the defective part level after the application of a set of test vectors is not a simple problem. In order for the defective part level to decrease, both the excitation and observation of defects must occur. This research shows that the probability of the exciting an as yet undetected defect does indeed decrease exponentially as the number of observations increases. In addition, a new defective part level model is proposed which accurately predicts the final defective part level (even at high fault coverages) for several benchmark circuits and which continues to provide good predictions even as changes are made in the set of test patterns applied.
INDEX TERMS
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CITATION

M. R. Grimaila, M. R. Mecer, J. Dworak, L. Wang and S. Lee, "Enhanced DO-RE-ME Based Defect Level Prediction Using Defect Site Aggregation-MPG-D," Proceedings International Test Conference 2000 (IEEE Cat. No.00CH37159)(ITC), Atlantic City, NJ, USA, 2000, pp. 930.
doi:10.1109/TEST.2000.894304
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