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2013 IEEE International Test Conference (ITC) (2000)
Atlantic City, NJ, USA
Oct. 3, 2000 to Oct. 5, 2000
ISSN: 1089-3539
ISBN: 0-7803-6546-1
pp: 619
zSince 1990, architectural innovations and implementation breakthroughs have driven EPA from +/-250ps to +/-50ps, in a tester with the same waveform capabilities and the same cost per pin. Further progress, called for by new devices all over the application spectrum, is based on tight control of the ATE timing error budget, and addresses the fundamental challenge of source synchronous timing. The path to deep picosecond accuracy is driven by calibration technology.
Burnell G West, Luca Sartori, "THE PATH to ONE - PICOSECOND ACCURACY", 2013 IEEE International Test Conference (ITC), vol. 00, no. , pp. 619, 2000, doi:10.1109/TEST.2000.894256
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