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Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270) (1998)
Washington, D.C. USA
Oct. 18, 1998 to Oct. 23, 1998
ISSN: 1089-3539
ISBN: 0-7803-5093-6
pp: 1166
Janak H. Patel , University of Illinois at Urbana-Champaign
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CITATION

J. H. Patel, "Stuck-At Fault: A Fault Model for the Next Millennium," Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270)(ITC), Washington, D.C. USA, 1998, pp. 1166.
doi:10.1109/TEST.1998.743358
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