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Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270) (1998)
Washington, D.C. USA
Oct. 18, 1998 to Oct. 23, 1998
ISSN: 1089-3539
ISBN: 0-7803-5093-6
pp: 114
Andreas C. Pfahnl , Kinetrix, Inc.
John H. Lienhard V , Massachusetts Institute of Technology
Alexander H. Slocum , Massachusetts Institute of Technology
A very compact electrical test contactor assembly design for a handler is described that gives a means to better match the temperature of the contactors (-60 degC to 160 degC) and the devices under test (DUTs). The resulting design aims for tight temperature control (? 1 degC) of DUTs while minimizing the electrical transmission path length (~ 2.5 cm). A high thermal conductivity plate uses direct current (DC), electric resistance heaters and liquid nitrogen (LN2) to control the contactor temperatures. Tests at 90 degC confirm expected hot-temperature performance.

A. C. Pfahnl, J. H. Lienhard V and A. H. Slocum, "TEMPERATURE CONTROL OF A HANDLER TEST INTERFACE," Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270)(ITC), Washington, D.C. USA, 1998, pp. 114.
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