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Proceedings International Test Conference 1997 (1997)
Washington D.C.
Nov. 1, 1997 to Nov. 6, 1997
ISSN: 1089-3539
ISBN: 0-7803-4210-0
pp: 1031
Steven F. Oakland , IBM Microelectronics Division
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CITATION

S. F. Oakland, "WHY WOULD AN ASIC FOUNDRY ACCEPT ANYTHING LESS THAN FULL SCAN?," Proceedings International Test Conference 1997(ITC), Washington D.C., 1997, pp. 1031.
doi:10.1109/TEST.1997.639721
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