The Community for Technology Leaders
2013 IEEE International Test Conference (ITC) (1996)
Washington, D.C.
Oct. 20, 1996 to Oct. 25, 1996
ISSN: 1089-3539
ISBN: 0-7803-3543-0
pp: 294
Vamsi Boppana , University of Illinois
W. Kent Fuchs , Purdue University
Ismed Hartanto , University of Illinois
ABSTRACT
A significant problem with current diagnostic test generation techniques is the time spent in identifying diagnostic equivalences amongst fault pairs. Fault pair distance analysis is introduced in this paper to characterize diagnostically equivalent fault pairs and motivate local circuit transformations and structural analysis to identify equivalences in combinational circuits rapidly. Our results establish a connection between redundant faults and a specific class of diagnostically equivalent fault pairs. Structural analysis is then used to identify equivalences between fault pairs. Experimental results are presented on benchmark circuits to demonstrate the efficiency of the techniques.
INDEX TERMS
null
CITATION
Vamsi Boppana, W. Kent Fuchs, Ismed Hartanto, "Dignostic Fault Equivalence Identification Using Redundancy Information & Structural Analysis", 2013 IEEE International Test Conference (ITC), vol. 00, no. , pp. 294, 1996, doi:10.1109/TEST.1996.556974
104 ms
(Ver 3.3 (11022016))